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Deuermeier, Jonas and Wardenga, Hans F. and Morasch, Jan and Siol, Sebastian and Nandy, Suman and Calmeiro, Tomás and Martins, Rodrigo and Klein, Andreas and Fortunato, Elvira (2016):
Highly conductive grain boundaries in copper oxide thin films.
In: Journal of Applied Physics, p. 235303, 119, (23), ISSN 0021-8979,
[Online-Edition: http://dx.doi.org/10.1063/1.4954002],
[Article]

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