Englisch

Herzog, Alexander G. ; Benkner, Simon ; Zandi, Babak ; Buffolo, Matteo ; Van Driel, Willem D. ; Meneghini, Matteo ; Khanh, Tran Quoc (2023)
Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes.
In: IEEE Access, 11
doi: 10.1109/ACCESS.2023.3249478
Artikel, Bibliographie