Gottschalk, Sebastian ; Hahn, Horst ; Balogh, Adam G. ; Puff, Werner ; Kungl, Hans ; Hoffmann, Michael J. (2004):
A positron lifetime study of lanthanum and niobium doped Pb(Zr[sub 0.6]Ti[sub 0.4])O[sub 3].
In: Journal of Applied Physics, 96 (12), pp. 7464-7470. American Institute of Physics, ISSN 00218979,
[Article]
Abstract
A study of vacancy-related defects in lanthanum and niobium doped PbZr0.6Ti0.4O3 with dopant concentrations of 0–6 and 0–4 mol%, respectively has been performed using positron annihilation spectroscopy X-ray diffraction, and photoelectron spectroscopy. Positron lifetime as well as coincidence annihilation radiation Doppler line broadening measurements were carried out. It was found that the samples exhibit vacancylike defects that act as positron traps. Two main defect lifetime components were found in both sample sets one at <150 ps and one at <300 ps. These defect trapping sites can be attributed to single oxygen vacancies and A-site vacancies, respectively. Doppler line broadening measurements, however, do not show significant changes as a function of dopant concentrations in terms of shape S and wing W parameters.
Item Type: | Article |
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Erschienen: | 2004 |
Creators: | Gottschalk, Sebastian ; Hahn, Horst ; Balogh, Adam G. ; Puff, Werner ; Kungl, Hans ; Hoffmann, Michael J. |
Title: | A positron lifetime study of lanthanum and niobium doped Pb(Zr[sub 0.6]Ti[sub 0.4])O[sub 3] |
Language: | English |
Abstract: | A study of vacancy-related defects in lanthanum and niobium doped PbZr0.6Ti0.4O3 with dopant concentrations of 0–6 and 0–4 mol%, respectively has been performed using positron annihilation spectroscopy X-ray diffraction, and photoelectron spectroscopy. Positron lifetime as well as coincidence annihilation radiation Doppler line broadening measurements were carried out. It was found that the samples exhibit vacancylike defects that act as positron traps. Two main defect lifetime components were found in both sample sets one at <150 ps and one at <300 ps. These defect trapping sites can be attributed to single oxygen vacancies and A-site vacancies, respectively. Doppler line broadening measurements, however, do not show significant changes as a function of dopant concentrations in terms of shape S and wing W parameters. |
Journal or Publication Title: | Journal of Applied Physics |
Volume of the journal: | 96 |
Issue Number: | 12 |
Publisher: | American Institute of Physics |
Uncontrolled Keywords: | lead compounds, lanthanum, niobium, ferroelectric materials, positron annihilation, impurity-vacancy interactions, vacancies (crystal), impurity distribution, Doppler broadening, sintering, X-ray photoelectron spectra, X-ray diffraction |
Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Material Analytics 11 Department of Materials and Earth Sciences > Material Science > Joint Research Laboratory Nanomaterials DFG-Collaborative Research Centres (incl. Transregio) DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres Zentrale Einrichtungen DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > A - Synthesis DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > A - Synthesis > Subproject A2: Manufacturing and characterization of PZT-ceramics with defined defect chemistry DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > B - Characterisation DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > B - Characterisation > Subproject B2: Investigations of the defect structure and diffusion in ferroelectric materials |
Date Deposited: | 08 Feb 2013 08:20 |
URL / URN: | http://dx.doi.org/10.1063/1.1810198 |
Additional Information: | SFB 595 (Electric Fatigue In Functional Materials) |
Identification Number: | doi:10.1063/1.1810198 |
PPN: | |
Funders: | The authors gratefully acknowledge the financial support by German Research Foundation (DFG) within the frame of the Center of Excellence SFB 595 (Electric Fatigue In Functional Materials) Project. |
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