Wiegand, Sebastian ; Flege, Stefan ; Baake, Olaf ; Ensinger, Wolfgang (2013)
Effect of Different Calcination Temperatures and Post Annealing on the Properties of Acetic Acid Based Sol-Gel (Na0.5K0.5)NbO3 (NKN) Thin Films.
In: Journal of Materials Science & Technology
Article
Abstract
(Na0.5K0.5)NbO3 (NKN) lead free thin films were synthesized by means of an acetic acid based sol-gel process on Pt/Ti/SiO2/Si substrates. Na-acetate, K-acetate and Nb-pentaethoxide were used as metal precursors and acetic acid as the solvent. The effect of different calcination temperatures on the properties of the NKN films was investigated by X-ray diffraction, scanning electron microscopy, leakage current and hysteresis measurements. Low calcination temperatures led to low currents at high electric fields whereas high calcination temperatures led to low currents at low electric fields. Based on these findings calcination at low temperature was combined with a post annealing treatment. Low leakage currents of 4×10−4 A/cm² at 150 kV/cm and 2Pr and 2Ec values of 28 μC/cm² and 150 kV/cm, respectively, could be obtained. All films were single phase NKN with random crystal orientations and no crack or pore formation was visible on the surface.
Item Type: | Article |
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Erschienen: | 2013 |
Creators: | Wiegand, Sebastian ; Flege, Stefan ; Baake, Olaf ; Ensinger, Wolfgang |
Type of entry: | Bibliographie |
Title: | Effect of Different Calcination Temperatures and Post Annealing on the Properties of Acetic Acid Based Sol-Gel (Na0.5K0.5)NbO3 (NKN) Thin Films |
Language: | English |
Date: | 2013 |
Publisher: | Elsevier Science Publishing Company |
Journal or Publication Title: | Journal of Materials Science & Technology |
URL / URN: | http://dx.doi.org/10.1016/j.jmst.2012.11.012 |
Abstract: | (Na0.5K0.5)NbO3 (NKN) lead free thin films were synthesized by means of an acetic acid based sol-gel process on Pt/Ti/SiO2/Si substrates. Na-acetate, K-acetate and Nb-pentaethoxide were used as metal precursors and acetic acid as the solvent. The effect of different calcination temperatures on the properties of the NKN films was investigated by X-ray diffraction, scanning electron microscopy, leakage current and hysteresis measurements. Low calcination temperatures led to low currents at high electric fields whereas high calcination temperatures led to low currents at low electric fields. Based on these findings calcination at low temperature was combined with a post annealing treatment. Low leakage currents of 4×10−4 A/cm² at 150 kV/cm and 2Pr and 2Ec values of 28 μC/cm² and 150 kV/cm, respectively, could be obtained. All films were single phase NKN with random crystal orientations and no crack or pore formation was visible on the surface. |
Uncontrolled Keywords: | Sol-gel process, Na0.5K0.5)NbO3, Thin film, Perovskite, Lead-free, Piezo material |
Identification Number: | doi:10.1016/j.jmst.2012.11.012 |
Divisions: | 11 Department of Materials and Earth Sciences > Material Science > Material Analytics 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences |
Date Deposited: | 14 Jan 2013 11:55 |
Last Modified: | 05 Mar 2013 10:04 |
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