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XPS analysis of wet chemical etching of GaAs(110) by Br2/H20: Comparison of emersion and model experiments

Beerbom, M. ; Henrion, O. ; Klein, Andreas ; Mayer, T. ; Jaegermann, W. (2000)
XPS analysis of wet chemical etching of GaAs(110) by Br2/H20: Comparison of emersion and model experiments.
In: Electrochimica Acta, 45
doi: 10.1016/S0013-4686(00)00618-6
Article, Bibliographie

Item Type: Article
Erschienen: 2000
Creators: Beerbom, M. ; Henrion, O. ; Klein, Andreas ; Mayer, T. ; Jaegermann, W.
Type of entry: Bibliographie
Title: XPS analysis of wet chemical etching of GaAs(110) by Br2/H20: Comparison of emersion and model experiments
Language: English
Date: 1 November 2000
Journal or Publication Title: Electrochimica Acta
Volume of the journal: 45
DOI: 10.1016/S0013-4686(00)00618-6
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 19 Nov 2008 16:00
Last Modified: 20 Feb 2020 13:27
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