Beerbom, M. ; Henrion, O. ; Klein, Andreas ; Mayer, T. ; Jaegermann, W. (2000):
XPS analysis of wet chemical etching of GaAs(110) by Br2/H20: Comparison of emersion and model experiments.
In: Electrochimica Acta, 45, pp. 4663-4672. ISSN 00134686,
[Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 2000 |
| Creators: | Beerbom, M. ; Henrion, O. ; Klein, Andreas ; Mayer, T. ; Jaegermann, W. |
| Title: | XPS analysis of wet chemical etching of GaAs(110) by Br2/H20: Comparison of emersion and model experiments |
| Language: | English |
| Journal or Publication Title: | Electrochimica Acta |
| Volume of the journal: | 45 |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Surface Science |
| Date Deposited: | 19 Nov 2008 16:00 |
| Identification Number: | doi:10.1016/S0013-4686(00)00618-6 |
| License: | [undefiniert] |
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| Suche nach Titel in: | TUfind oder in Google |
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