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An investigation on Point Defects in Silicon Carbide

Puff, W. ; Boumerzoug, M. ; Brown, J. ; Mascher, P. ; MacDonald, D. ; Simpson, P. J. ; Balogh, Adam G. (1995)
An investigation on Point Defects in Silicon Carbide.
In: Applied Physics A: Materials Science and Processing, 61 (1)
doi: 10.1007/BF01538211
Article, Bibliographie

Item Type: Article
Erschienen: 1995
Creators: Puff, W. ; Boumerzoug, M. ; Brown, J. ; Mascher, P. ; MacDonald, D. ; Simpson, P. J. ; Balogh, Adam G.
Type of entry: Bibliographie
Title: An investigation on Point Defects in Silicon Carbide
Language: English
Date: 14 June 1995
Publisher: Springer
Journal or Publication Title: Applied Physics A: Materials Science and Processing
Volume of the journal: 61
Issue Number: 1
DOI: 10.1007/BF01538211
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Material Analytics
Date Deposited: 14 Jun 2011 12:52
Last Modified: 08 Apr 2020 12:56
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