Puff, W. ; Boumerzoug, M. ; Brown, J. ; Mascher, P. ; MacDonald, D. ; Simpson, P. J. ; Balogh, Adam G. (1995):
An investigation on Point Defects in Silicon Carbide.
In: Applied Physics A: Materials Science and Processing, 61 (1), pp. 55-58. Springer, DOI: 10.1007/BF01538211,
[Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 1995 |
| Creators: | Puff, W. ; Boumerzoug, M. ; Brown, J. ; Mascher, P. ; MacDonald, D. ; Simpson, P. J. ; Balogh, Adam G. |
| Title: | An investigation on Point Defects in Silicon Carbide |
| Language: | English |
| Journal or Publication Title: | Applied Physics A: Materials Science and Processing |
| Volume of the journal: | 61 |
| Issue Number: | 1 |
| Publisher: | Springer |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Material Analytics |
| Date Deposited: | 14 Jun 2011 12:52 |
| DOI: | 10.1007/BF01538211 |
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