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Structure of thin block copolymer films studied by X-ray reflectivity

Mutter, R. ; Strobl, G. ; Stühn, B. (1993)
Structure of thin block copolymer films studied by X-ray reflectivity.
In: Fresenius Journal of Analytical Chemistry, 346 (1-3)
Article, Bibliographie

Abstract

X-ray reflectivity may be used to determine the internal structure of thin polymer films. An electron density difference of 10% for polystyrene and polyisoprene is sufficient to distinguish between a random distribution of lamellae, complete orientation parallel to the substrate surface and a surface induced formation of lamellae. The disappearance of the lamellar Bragg-peaks, with heating of the film, shows the transition into the disordered state.

Item Type: Article
Erschienen: 1993
Creators: Mutter, R. ; Strobl, G. ; Stühn, B.
Type of entry: Bibliographie
Title: Structure of thin block copolymer films studied by X-ray reflectivity
Language: English
Date: May 1993
Journal or Publication Title: Fresenius Journal of Analytical Chemistry
Volume of the journal: 346
Issue Number: 1-3
Abstract:

X-ray reflectivity may be used to determine the internal structure of thin polymer films. An electron density difference of 10% for polystyrene and polyisoprene is sufficient to distinguish between a random distribution of lamellae, complete orientation parallel to the substrate surface and a surface induced formation of lamellae. The disappearance of the lamellar Bragg-peaks, with heating of the film, shows the transition into the disordered state.

Additional Information:

7TH WORKING CONF ON APPLIED SURFACE ANALYSIS, JULICH, GERMANY, JUN 22-25, 1992

Divisions: 05 Department of Physics
05 Department of Physics > Institute for condensed matter physics (2021 merged in Institute for Condensed Matter Physics)
Date Deposited: 26 Feb 2010 13:52
Last Modified: 05 Mar 2013 09:32
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