Mutter, R. ; Strobl, G. ; Stühn, B. (1993)
Structure of thin block copolymer films studied by X-ray reflectivity.
In: Fresenius Journal of Analytical Chemistry, 346 (1-3)
Article
Abstract
X-ray reflectivity may be used to determine the internal structure of thin polymer films. An electron density difference of 10% for polystyrene and polyisoprene is sufficient to distinguish between a random distribution of lamellae, complete orientation parallel to the substrate surface and a surface induced formation of lamellae. The disappearance of the lamellar Bragg-peaks, with heating of the film, shows the transition into the disordered state.
| Item Type: | Article |
|---|---|
| Erschienen: | 1993 |
| Creators: | Mutter, R. ; Strobl, G. ; Stühn, B. |
| Type of entry: | Bibliographie |
| Title: | Structure of thin block copolymer films studied by X-ray reflectivity |
| Language: | English |
| Date: | May 1993 |
| Journal or Publication Title: | Fresenius Journal of Analytical Chemistry |
| Volume of the journal: | 346 |
| Issue Number: | 1-3 |
| Abstract: | X-ray reflectivity may be used to determine the internal structure of thin polymer films. An electron density difference of 10% for polystyrene and polyisoprene is sufficient to distinguish between a random distribution of lamellae, complete orientation parallel to the substrate surface and a surface induced formation of lamellae. The disappearance of the lamellar Bragg-peaks, with heating of the film, shows the transition into the disordered state. |
| Additional Information: | 7TH WORKING CONF ON APPLIED SURFACE ANALYSIS, JULICH, GERMANY, JUN 22-25, 1992 |
| Divisions: | 05 Department of Physics 05 Department of Physics > Institute for condensed matter physics (2021 merged in Institute for Condensed Matter Physics) |
| Date Deposited: | 26 Feb 2010 13:52 |
| Last Modified: | 05 Mar 2013 09:32 |
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