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On the assessment of cracks within the interface of thin layers on a substrate

Mueller, A. ; Goswami, S. ; Hohe, J. ; Becker, Wilfried (2004)
On the assessment of cracks within the interface of thin layers on a substrate.
Conference or Workshop Item, Bibliographie

Item Type: Conference or Workshop Item
Erschienen: 2004
Creators: Mueller, A. ; Goswami, S. ; Hohe, J. ; Becker, Wilfried
Type of entry: Bibliographie
Title: On the assessment of cracks within the interface of thin layers on a substrate
Language: English
Date: 2004
Series: PAMM - Proceedings in Applied Mathematics and Mechanics
Series Volume: 4
Divisions: Study Areas > Study Area Mechanic
16 Department of Mechanical Engineering > Institute of Structural Mechanics (FSM)
16 Department of Mechanical Engineering
Study Areas
Date Deposited: 20 Nov 2008 08:19
Last Modified: 05 Mar 2013 09:02
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