Hohlfeld, Olaf ; Schuster, G. ; Werthschützky, Roland (2000):
Monitoring system evaluating stress produced by tongue movements on the palate.
In: World Micro-Technologies Congress <2000, Hannover>: Proceedings. S. 237-241, [Conference or Workshop Item]
Item Type: | Conference or Workshop Item |
---|---|
Erschienen: | 2000 |
Creators: | Hohlfeld, Olaf ; Schuster, G. ; Werthschützky, Roland |
Title: | Monitoring system evaluating stress produced by tongue movements on the palate |
Language: | English |
Series: | World Micro-Technologies Congress <2000, Hannover>: Proceedings. S. 237-241 |
Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Measurement and Sensor Technology 18 Department of Electrical Engineering and Information Technology > Institute for Electromechanical Design (dissolved 18.12.2018) |
Date Deposited: | 19 Nov 2008 16:25 |
License: | [undefiniert] |
PPN: | |
Export: | |
Suche nach Titel in: | TUfind oder in Google |
![]() |
Send an inquiry |
Options (only for editors)
![]() |
Show editorial Details |