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Electrical characterization and failure analysis using operando TEM

Pivak, Yevheniy ; Perez-Garza, Hector H. ; Zintler, Alexander ; Molina-Luna, Leopoldo (2017)
Electrical characterization and failure analysis using operando TEM.
ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis. Pasadena, Californien, USA (5.9.2017)
Conference or Workshop Item, Bibliographie

Abstract

We present here the development of a system that allows for in-situ studies inside the Transmission Electron Microscope (TEM). Functionalized Microelectromechanical Systems (MEMS) used as sample carriers, referred to as Nano-Chips, contain up to eight electrodes used for simultaneous biasing and heating purposes, enabling electro-thermal characterization of various sample types inside the TEM under real life dynamic conditions. This operando approach is an ideal method to study failure analysis of semiconductor materials, performance of resistive switching devices, batteries, fuel cells, piezoceramics and many more.

Item Type: Conference or Workshop Item
Erschienen: 2017
Creators: Pivak, Yevheniy ; Perez-Garza, Hector H. ; Zintler, Alexander ; Molina-Luna, Leopoldo
Type of entry: Bibliographie
Title: Electrical characterization and failure analysis using operando TEM
Language: English
Date: 12 January 2017
Publisher: ASM INTERNATIONAL, 9503 KINSMAN RD, MATERIALS PARK, OH 44073 USA
Event Title: ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis
Event Location: Pasadena, Californien, USA
Event Dates: 5.9.2017
Abstract:

We present here the development of a system that allows for in-situ studies inside the Transmission Electron Microscope (TEM). Functionalized Microelectromechanical Systems (MEMS) used as sample carriers, referred to as Nano-Chips, contain up to eight electrodes used for simultaneous biasing and heating purposes, enabling electro-thermal characterization of various sample types inside the TEM under real life dynamic conditions. This operando approach is an ideal method to study failure analysis of semiconductor materials, performance of resistive switching devices, batteries, fuel cells, piezoceramics and many more.

Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Advanced Electron Microscopy (aem)
Date Deposited: 10 Dec 2018 10:12
Last Modified: 20 Dec 2018 15:26
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