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Number of items: 7.


Theel, Oliver and Pagnia, (1998):
Optimal replica control protocols exhibit symmetric operation availabilities.
In: FTCS-28: International Symposium on Fault-Tolerant Computing <28, 1998, München>: Proceedings. S. 252-261, [Conference or Workshop Item]

Theel, Oliver and Pagnia, (1996):
Bounded dynamic data allocation in distributed systems.
In: International Conference on High Performance Computing <3, 1996, Trivandrum, India>: Proceedings. - Los Alamitos, Calif.: IEEE Computer Soc. Press, 1996. S. 126-131, Los Alamitos. Calif, IEEE Computer Soc. Press, [Conference or Workshop Item]

Horn, Joachim and Marx, and Weiss, and Hartnagel, and Stehle, and Bischoff, and Pagnia, (1995):
High resolution surface characterization using STM light emission techniques.
185-18, In: Passivation of metals and semiconductors. Hrsg.: K.E. Heusler. S. 145-154, Aedermannsdorf: Trans Tech Publ., 1995, Aedermannsdorf, Trans Tech Publ, [Book Section]


Theel, Oliver and Pagnia, and Berger, and Liebig, (1998):
Enhancing the world-wide web through transparent integration of document replication.
In: International Conference on Information Systems, Analysis, and Synthesis = Part of the: World Multiconference on Systemics, Cybernetics and Informatics (SCI'98) <1998, Orlando, FL>: Proceedings. S. 334-341, [Conference or Workshop Item]

Theel, Oliver and Pagnia, (1996):
Static and dynamic analysis of bounded dynamic data allocation in distributed systems.
THD-BS, Darmstadt, Techn. Hochschule, FG Betriebssysteme, [Book]

Stehle, M. and Bischoff, and Pagnia, and Horn, and Marx, and Weiss, and Hartnagel, (1995):
Time-resolved luminiscsence measurements on GaAs homostructures using pulse excitation of a scanning tunneling microscope.
In: Journal of vacuum science and technology. B 13 (1995), S. 305-307, [Article]

Urban, J. and Bräuer, and McKinnon, and Horn, and Hjort, and Pagnia, and Koops, and Hartnagel, (1995):
The scanning tunneling microscope as a tool for nanolithography: writing nanostructures on Si (110) in air.
In: Microelectronic engineering. 27 (1995), S. 113-116, [Article]

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