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Electrical conductivity measurements with submicrometer lateral resolution

Kazimierski, P. and Lehmberg, (1998):
Electrical conductivity measurements with submicrometer lateral resolution.
In: Surface & coatings technology. 98 (1998), S. 939-943, [Article]

Item Type: Article
Erschienen: 1998
Creators: Kazimierski, P. and Lehmberg,
Title: Electrical conductivity measurements with submicrometer lateral resolution
Language: German
Journal or Publication Title: Surface & coatings technology. 98 (1998), S. 939-943
Divisions: 05 Department of Physics
Date Deposited: 19 Nov 2008 16:19
License: [undefiniert]
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