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Modelling the Impact of PCB traces on the Performance of an RF Amplifier in an ASIC with the help of CST-Studio Full Field EM Simulations and Cadence Virtuoso Co-Simulations

Malhotra, Harmann and Lakshminarayanan, Sreekesh and Hofmann, Klaus (2017):
Modelling the Impact of PCB traces on the Performance of an RF Amplifier in an ASIC with the help of CST-Studio Full Field EM Simulations and Cadence Virtuoso Co-Simulations.
In: CST European User Conference, Darmstadt, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2017
Creators: Malhotra, Harmann and Lakshminarayanan, Sreekesh and Hofmann, Klaus
Title: Modelling the Impact of PCB traces on the Performance of an RF Amplifier in an ASIC with the help of CST-Studio Full Field EM Simulations and Cadence Virtuoso Co-Simulations
Language: English
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering > Integrated Electronic Systems
18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering
Event Title: CST European User Conference
Event Location: Darmstadt
Date Deposited: 19 Apr 2018 13:46
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