Sachan, Ritesh ; Zhang, Yanwen ; Ou, Xin ; Trautmann, Christina ; Chisholm, Matthew F. ; Weber, William J. (2017)
New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy.
In: Journal of Materials Research, 32 (05)
doi: 10.1557/jmr.2016.418
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Here, we demonstrate the enhanced imaging capabilities of an aberration corrected scanning transmission electron microscope to advance the understanding of ion track structure in pyrochlore structured materials (i.e., Gd2Ti2O7 and Gd2TiZrO7). Track formation occurs due to the inelastic transfer of energy from incident ions to electrons, and atomic-level details of track morphology as a function of energy-loss are revealed in the present work. A comparison of imaging details obtained by varying collection angles of detectors is discussed in the present work. A quantitative analysis of phase identification using high-angle annular dark field imaging is performed on the ion tracks. Finally, a novel 3-dimensional track reconstruction method is provided that is based on depth-dependent imaging of the ion tracks. The technique is used in extracting the atomic-level details of nanoscale features, such as the disordered ion tracks, which are embedded in relatively thicker matrix. Another relevance of the method is shown by measuring the tilt of the ion tracks relative to the electron beam incidence that helps in knowing the structure and geometry of ion tracks quantitatively.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2017 |
| Autor(en): | Sachan, Ritesh ; Zhang, Yanwen ; Ou, Xin ; Trautmann, Christina ; Chisholm, Matthew F. ; Weber, William J. |
| Art des Eintrags: | Bibliographie |
| Titel: | New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy |
| Sprache: | Englisch |
| Publikationsjahr: | 14 März 2017 |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Journal of Materials Research |
| Jahrgang/Volume einer Zeitschrift: | 32 |
| (Heft-)Nummer: | 05 |
| DOI: | 10.1557/jmr.2016.418 |
| URL / URN: | https://doi.org/10.1557/jmr.2016.418 |
| Kurzbeschreibung (Abstract): | Here, we demonstrate the enhanced imaging capabilities of an aberration corrected scanning transmission electron microscope to advance the understanding of ion track structure in pyrochlore structured materials (i.e., Gd2Ti2O7 and Gd2TiZrO7). Track formation occurs due to the inelastic transfer of energy from incident ions to electrons, and atomic-level details of track morphology as a function of energy-loss are revealed in the present work. A comparison of imaging details obtained by varying collection angles of detectors is discussed in the present work. A quantitative analysis of phase identification using high-angle annular dark field imaging is performed on the ion tracks. Finally, a novel 3-dimensional track reconstruction method is provided that is based on depth-dependent imaging of the ion tracks. The technique is used in extracting the atomic-level details of nanoscale features, such as the disordered ion tracks, which are embedded in relatively thicker matrix. Another relevance of the method is shown by measuring the tilt of the ion tracks relative to the electron beam incidence that helps in knowing the structure and geometry of ion tracks quantitatively. |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Ionenstrahlmodifizierte Materialien 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften |
| Hinterlegungsdatum: | 29 Dez 2017 10:21 |
| Letzte Änderung: | 29 Dez 2017 10:21 |
| PPN: | |
| Sponsoren: | This research was supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Science and Engineering Division. |
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