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SAXS investigation of un-etched and etched ion tracks in polycarbonate

Hossain, U. H. and Rodriguez, M. D. and Schauries, D. and Hadley, A. and Schleberger, M. and Trautmann, C. and Mudie, S. and Kluth, P. (2017):
SAXS investigation of un-etched and etched ion tracks in polycarbonate.
In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier Science Publishing, pp. 293-297, 409, ISSN 0168583X,
DOI: 10.1016/j.nimb.2017.04.023,
[Online-Edition: https://doi.org/10.1016/j.nimb.2017.04.023],
[Article]

Abstract

Investigation of the ion track morphologies and track etching behaviour in polycarbonate (PC) films was carried out using synchrotron based small-angle X-ray scattering (SAXS) measurements. The tracks were induced by Au ions with kinetic energies of 1.7 and 2.2 GeV with applied fluences between 1 × 1010 and 1 × 1012 ions/cm2. The average radii of the un-etched tracks were studied as a function of the irradiation fluence, indicating a general ion induced degradation of the polymer, with a simultaneous increase in ion track radius from 2.6 ± 0.002 nm to 3.4 ± 0.03 nm. Chemical etching of the ion tracks in PC leads to the formation of cylindrical pores. The pore radius increases linearly with etching time. In 3 M NaOH at 55 °C, a radial etching rate of 9.2 nm/min is observed.

Item Type: Article
Erschienen: 2017
Creators: Hossain, U. H. and Rodriguez, M. D. and Schauries, D. and Hadley, A. and Schleberger, M. and Trautmann, C. and Mudie, S. and Kluth, P.
Title: SAXS investigation of un-etched and etched ion tracks in polycarbonate
Language: English
Abstract:

Investigation of the ion track morphologies and track etching behaviour in polycarbonate (PC) films was carried out using synchrotron based small-angle X-ray scattering (SAXS) measurements. The tracks were induced by Au ions with kinetic energies of 1.7 and 2.2 GeV with applied fluences between 1 × 1010 and 1 × 1012 ions/cm2. The average radii of the un-etched tracks were studied as a function of the irradiation fluence, indicating a general ion induced degradation of the polymer, with a simultaneous increase in ion track radius from 2.6 ± 0.002 nm to 3.4 ± 0.03 nm. Chemical etching of the ion tracks in PC leads to the formation of cylindrical pores. The pore radius increases linearly with etching time. In 3 M NaOH at 55 °C, a radial etching rate of 9.2 nm/min is observed.

Journal or Publication Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume: 409
Publisher: Elsevier Science Publishing
Uncontrolled Keywords: Small-angle X-ray scattering (SAXS), Polycarbonate (PC), Swift heavy ion tracks, Radiation degradation
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Ion-Beam-Modified Materials
Date Deposited: 29 Dec 2017 09:55
DOI: 10.1016/j.nimb.2017.04.023
Official URL: https://doi.org/10.1016/j.nimb.2017.04.023
Funders: We acknowledge the DFG (HO 5722/1-1 and SCHL 384-17/1) and the Australian Research Council for financial support.
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