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X-ray photoelectron spectroscopy characterization of ion-implanted Ti6Al4V

Schmiedgen, M. and Baretzky, and Schminke, and Schmidt, (1997):
X-ray photoelectron spectroscopy characterization of ion-implanted Ti6Al4V.
In: European Conference on Application of Surface and Interface Analysis <7, 1997>: Proceedings. Hrsg.: I. Olefjord (u.a.) S. 143-146, Chichester: Wiley, 1997,
Chichester, Wiley, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1997
Creators: Schmiedgen, M. and Baretzky, and Schminke, and Schmidt,
Title: X-ray photoelectron spectroscopy characterization of ion-implanted Ti6Al4V
Language: English
Series Name: European Conference on Application of Surface and Interface Analysis <7, 1997>: Proceedings. Hrsg.: I. Olefjord (u.a.) S. 143-146
Place of Publication: Chichester
Publisher: Wiley
Edition: Chichester: Wiley, 1997
Divisions: 11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences)
11 Department of Materials and Earth Sciences
Date Deposited: 19 Nov 2008 16:04
License: [undefiniert]
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