Schmiedgen, M. ; Baretzky, ; Schminke, ; Schmidt, (1997):
X-ray photoelectron spectroscopy characterization of ion-implanted Ti6Al4V.
In: European Conference on Application of Surface and Interface Analysis <7, 1997>: Proceedings. Hrsg.: I. Olefjord (u.a.) S. 143-146, Chichester: Wiley, 1997, Chichester, Wiley, [Conference or Workshop Item]
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 1997 |
| Creators: | Schmiedgen, M. ; Baretzky, ; Schminke, ; Schmidt, |
| Title: | X-ray photoelectron spectroscopy characterization of ion-implanted Ti6Al4V |
| Language: | English |
| Series: | European Conference on Application of Surface and Interface Analysis <7, 1997>: Proceedings. Hrsg.: I. Olefjord (u.a.) S. 143-146 |
| Place of Publication: | Chichester |
| Publisher: | Wiley |
| Edition: | Chichester: Wiley, 1997 |
| Divisions: | 11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences) 11 Department of Materials and Earth Sciences |
| Date Deposited: | 19 Nov 2008 16:04 |
| License: | [undefiniert] |
| Export: | |
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