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Scanning of Silicon Wafers in Contact with Aqueous CTAB Solutions below the CMC

Lüderitz, L. A. C. ; Klitzing, R. von (2012):
Scanning of Silicon Wafers in Contact with Aqueous CTAB Solutions below the CMC.
In: Langmuir, 28 (7), pp. 3360-3368. American Chemical Society, ISSN 0743-7463,
DOI: 10.1021/la202635a,
[Article]

Item Type: Article
Erschienen: 2012
Creators: Lüderitz, L. A. C. ; Klitzing, R. von
Title: Scanning of Silicon Wafers in Contact with Aqueous CTAB Solutions below the CMC
Language: English
Journal or Publication Title: Langmuir
Journal volume: 28
Number: 7
Publisher: American Chemical Society
Uncontrolled Keywords: SFB1194_A09
Divisions: 05 Department of Physics
05 Department of Physics > Institute for condensed matter physics (2021 merged in Institute for Condensed Matter Physics)
Date Deposited: 28 Apr 2017 11:01
DOI: 10.1021/la202635a
Official URL: https://pubs.acs.org/doi/10.1021/la202635a
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