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Surface Cation Segregation and its Effect on the Oxygen Reduction Reaction on Mixed Conducting Electrodes Investigated by ToF-SIMS and ICP-OES

Kubicek, Markus ; Limbeck, A. ; Frömling, Till ; Hutter, H. ; Fleig, J. (2011)
Surface Cation Segregation and its Effect on the Oxygen Reduction Reaction on Mixed Conducting Electrodes Investigated by ToF-SIMS and ICP-OES.
In: The Electrochemical Society, 35 (1)
doi: 10.1149/1.3570187
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

La0.6Sr0.4CoO3-δ (LSC) thin film electrodes on yttria stabilized zirconia (YSZ) were investigated by impedance spectroscopy, inductively coupled plasma optical emission spectrometry (ICP-OES) and time of flight secondary ion mass spectrometry (ToF-SIMS). Effects caused by different film deposition temperatures, thermal annealing and chemical etching were studied. Correlations between changes in electrode polarization resistance of oxygen reduction and surface composition were found. The surface cation composition was analyzed by ToF-SIMS and ICP-OES measurements of in situ etched LSC films allowing depth resolved compositional analysis with nominally sub nm resolution. High resolution scanning electron microscopy images illustrate changes in surface morphology.

Typ des Eintrags: Artikel
Erschienen: 2011
Autor(en): Kubicek, Markus ; Limbeck, A. ; Frömling, Till ; Hutter, H. ; Fleig, J.
Art des Eintrags: Bibliographie
Titel: Surface Cation Segregation and its Effect on the Oxygen Reduction Reaction on Mixed Conducting Electrodes Investigated by ToF-SIMS and ICP-OES
Sprache: Englisch
Publikationsjahr: 1 März 2011
Verlag: ECS
Titel der Zeitschrift, Zeitung oder Schriftenreihe: The Electrochemical Society
Jahrgang/Volume einer Zeitschrift: 35
(Heft-)Nummer: 1
DOI: 10.1149/1.3570187
Kurzbeschreibung (Abstract):

La0.6Sr0.4CoO3-δ (LSC) thin film electrodes on yttria stabilized zirconia (YSZ) were investigated by impedance spectroscopy, inductively coupled plasma optical emission spectrometry (ICP-OES) and time of flight secondary ion mass spectrometry (ToF-SIMS). Effects caused by different film deposition temperatures, thermal annealing and chemical etching were studied. Correlations between changes in electrode polarization resistance of oxygen reduction and surface composition were found. The surface cation composition was analyzed by ToF-SIMS and ICP-OES measurements of in situ etched LSC films allowing depth resolved compositional analysis with nominally sub nm resolution. High resolution scanning electron microscopy images illustrate changes in surface morphology.

Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Nichtmetallisch-Anorganische Werkstoffe
11 Fachbereich Material- und Geowissenschaften
Hinterlegungsdatum: 23 Jan 2017 07:12
Letzte Änderung: 23 Jan 2017 07:12
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