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Low temperature annealing effects on the stability of Bi nanowires

Cassinelli, Marco ; Romanenko, Anton ; Reith, Heiko ; Völklein, Friedemann ; Sigle, Wilfried ; Trautmann, Christina ; Toimil-Molares, Maria Eugenia (2016)
Low temperature annealing effects on the stability of Bi nanowires.
In: physica status solidi (a), 213 (3)
doi: 10.1002/pssa.201532613
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

To investigate the physical properties of Bi nanowires and to explore their possible implementation in thermoelectric devices, it is essential to understand their chemical and thermal stability in air both at room and moderate temperatures. In this work, we study the influence of low temperature annealing processes on the morphology and composition of the wires by scanning and transmission electron microscopy and by Raman spectroscopy, revealing the formation of a metal oxide phase. This oxidation process initiates an increase of the nanowires surface roughness at low annealing temperatures, while clear protuberances are formed at 250 °C. Difficulties to electrically contact single Bi nanowires, as well as the high resistance values measured and reported by other groups, are attributed to this oxidation process, which constitutes a clear challenge for the reliable characterization of Bi nanowires and the investigation of their performance.

Typ des Eintrags: Artikel
Erschienen: 2016
Autor(en): Cassinelli, Marco ; Romanenko, Anton ; Reith, Heiko ; Völklein, Friedemann ; Sigle, Wilfried ; Trautmann, Christina ; Toimil-Molares, Maria Eugenia
Art des Eintrags: Bibliographie
Titel: Low temperature annealing effects on the stability of Bi nanowires
Sprache: Englisch
Publikationsjahr: März 2016
Verlag: WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany
Titel der Zeitschrift, Zeitung oder Schriftenreihe: physica status solidi (a)
Jahrgang/Volume einer Zeitschrift: 213
(Heft-)Nummer: 3
DOI: 10.1002/pssa.201532613
Kurzbeschreibung (Abstract):

To investigate the physical properties of Bi nanowires and to explore their possible implementation in thermoelectric devices, it is essential to understand their chemical and thermal stability in air both at room and moderate temperatures. In this work, we study the influence of low temperature annealing processes on the morphology and composition of the wires by scanning and transmission electron microscopy and by Raman spectroscopy, revealing the formation of a metal oxide phase. This oxidation process initiates an increase of the nanowires surface roughness at low annealing temperatures, while clear protuberances are formed at 250 °C. Difficulties to electrically contact single Bi nanowires, as well as the high resistance values measured and reported by other groups, are attributed to this oxidation process, which constitutes a clear challenge for the reliable characterization of Bi nanowires and the investigation of their performance.

Freie Schlagworte: annealing, bismuth, nanowires, oxides, Raman spectroscopy, scanning electron microscopy, thermoelectrics
Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Ionenstrahlmodifizierte Materialien
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
11 Fachbereich Material- und Geowissenschaften
Hinterlegungsdatum: 15 Jun 2016 08:42
Letzte Änderung: 15 Jun 2016 08:42
PPN:
Sponsoren: We thank the Deutsche Forschungsgemeinschaft (DFG) for financial support within the priority program SPP 1386., M.C. thanks the Helmholtz Graduate School for Hadron and Ion Research “HGS-HIRe” for the financial support.
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