Multirate Time Integration of Field/Circuit Coupled Problems by Schur Complements

Schöps, Sebastian and Bartel, Andreas and De Gersem, Herbert Michielsen, Bastiaan and Poirier, Jean-René (eds.) (2012):
Multirate Time Integration of Field/Circuit Coupled Problems by Schur Complements.
In: Mathematics in Industry, In: Scientific Computing in Electrical Engineering SCEE 2010, Berlin, Springer, pp. 243-251, [Online-Edition: http://dx.doi.org/10.1007/978-3-642-22453-9_26],
[Book Section]

Official URL: http://dx.doi.org/10.1007/978-3-642-22453-9_26

Item Type:	Book Section
Erschienen:	2012
Editors:	Michielsen, Bastiaan and Poirier, Jean-René
Creators:	Schöps, Sebastian and Bartel, Andreas and De Gersem, Herbert
Title:	Multirate Time Integration of Field/Circuit Coupled Problems by Schur Complements
Language:	English
Title of Book:	Scientific Computing in Electrical Engineering SCEE 2010
Series Name:	Mathematics in Industry
Volume:	16
Place of Publication:	Berlin
Publisher:	Springer
ISBN:	978-3-642-22452-2
Uncontrolled Keywords:	field-circuit, multirate
Divisions:	18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory (from 01.01.2019 renamed Institute for Accelerator Science and Electromagnetic Fields) 18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory (from 01.01.2019 renamed Institute for Accelerator Science and Electromagnetic Fields) > Computational Engineering (from 01.01.2019 renamed Computational Electromagnetics) Exzellenzinitiative Exzellenzinitiative > Graduate Schools Exzellenzinitiative > Graduate Schools > Graduate School of Computational Engineering (CE) Zentrale Einrichtungen
Event Title:	Scientific Computing in Electrical Engineering SCEE 2010. Ed. By Bastiaan Michielsen and Jean-René Poirier. Mathematics in Industry. Berlin: Springer.
Date Deposited:	14 Mar 2016 17:17
Official URL:	http://dx.doi.org/10.1007/978-3-642-22453-9_26
Additional Information:	TEMF-Pub-DB TEMF002520
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