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DAE-Index and Convergence Analysis of Lumped Electric Circuits Refined by 3-D Magnetoquasistatic Conductor Models

Schöps, Sebastian and Bartel, Andreas and De Gersem, Herbert and Günther, Michael
Roos, Janne and Costa, Luis R. J. (eds.) (2010):
DAE-Index and Convergence Analysis of Lumped Electric Circuits Refined by 3-D Magnetoquasistatic Conductor Models.
In: Scientific Computing in Electrical Engineering SCEE 2008, Berlin, Springer, [Online-Edition: http://dx.doi.org/10.1007/978-3-642-12294-1_43],
[Book Section]

Item Type: Book Section
Erschienen: 2010
Editors: Roos, Janne and Costa, Luis R. J.
Creators: Schöps, Sebastian and Bartel, Andreas and De Gersem, Herbert and Günther, Michael
Title: DAE-Index and Convergence Analysis of Lumped Electric Circuits Refined by 3-D Magnetoquasistatic Conductor Models
Language: English
Title of Book: Scientific Computing in Electrical Engineering SCEE 2008
Series Name: Springer Mathematics in Industry
Volume: 14
Place of Publication: Berlin
Publisher: Springer
ISBN: 978-3-642-12294-1
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory (from 01.01.2019 renamed Institute for Accelerator Science and Electromagnetic Fields)
18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory (from 01.01.2019 renamed Institute for Accelerator Science and Electromagnetic Fields) > Computational Engineering (from 01.01.2019 renamed Computational Electromagnetics)
Exzellenzinitiative
Exzellenzinitiative > Graduate Schools
Exzellenzinitiative > Graduate Schools > Graduate School of Computational Engineering (CE)
Zentrale Einrichtungen
Event Title: Scientific Computing in Electrical Engineering SCEE 2008. Ed. by Janne Roos and Luis R. J. Costa. Vol. 14. Mathematics in Industry. Berlin: Springer
Date Deposited: 14 Mar 2016 17:07
Official URL: http://dx.doi.org/10.1007/978-3-642-12294-1_43
Additional Information:

TEMF-Pub-DB TEMF002522

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