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Characterization of the Electron Source at the Photo Injector Test Facility at DESY Zeuthen

von Hartrott, Michael and Jaeschke, Eberhard and Krämer, Dieter and Carneiro, Jean-Paul and Flöttmann, Klaus and Rossbach, Jörg and Schreiber, Siegfried and Abrahamyan, Karen and Bähr, Jürgen W. and Bohnet, Ilja and Gensch, Ulrich and Grabosch, Hans-Jürgen and Han, Jang Hui and Krassilnikov, Mikhail and Lipka, Dirk and Miltchev, Velizar and Oppelt, Anne and Petrosyan, Bagrat and Stephan, Frank and Michelato, Paolo and Pagani, Carlo and Sertore, Daniele and Staykov, Lazar and Tsakov, Ivan and Sandner, Wolfgang and Will, Ingo and Ackermann, Wolfgang and Cee, Rainer and Müller, Wolfgang Franz Otto and Setzer, Stefan and Weiland, Thomas :
Characterization of the Electron Source at the Photo Injector Test Facility at DESY Zeuthen.
In: Proceedings of the 25th International Free Electron Laser Conference.
[Conference or Workshop Item] , (2003)

Item Type: Conference or Workshop Item
Erschienen: 2003
Creators: von Hartrott, Michael and Jaeschke, Eberhard and Krämer, Dieter and Carneiro, Jean-Paul and Flöttmann, Klaus and Rossbach, Jörg and Schreiber, Siegfried and Abrahamyan, Karen and Bähr, Jürgen W. and Bohnet, Ilja and Gensch, Ulrich and Grabosch, Hans-Jürgen and Han, Jang Hui and Krassilnikov, Mikhail and Lipka, Dirk and Miltchev, Velizar and Oppelt, Anne and Petrosyan, Bagrat and Stephan, Frank and Michelato, Paolo and Pagani, Carlo and Sertore, Daniele and Staykov, Lazar and Tsakov, Ivan and Sandner, Wolfgang and Will, Ingo and Ackermann, Wolfgang and Cee, Rainer and Müller, Wolfgang Franz Otto and Setzer, Stefan and Weiland, Thomas
Title: Characterization of the Electron Source at the Photo Injector Test Facility at DESY Zeuthen
Language: English
Divisions: 18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory
18 Department of Electrical Engineering and Information Technology
Event Title: Proceedings of the 25th International Free Electron Laser Conference
Date Deposited: 14 Mar 2016 16:48
Additional Information:

TEMF-Pub-DB TEMF000487

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