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Characterization of the Electron Source at the Photo Injector Test Facility at DESY Zeuthen

Hartrott, Michael von ; Jaeschke, Eberhard ; Krämer, Dieter ; Carneiro, Jean-Paul ; Flöttmann, Klaus ; Rossbach, Jörg ; Schreiber, Siegfried ; Abrahamyan, Karen ; Bähr, Jürgen W. ; Bohnet, Ilja ; Gensch, Ulrich ; Grabosch, Hans-Jürgen ; Han, Jang Hui ; Krassilnikov, Mikhail ; Lipka, Dirk ; Miltchev, Velizar ; Oppelt, Anne ; Petrosyan, Bagrat ; Stephan, Frank ; Michelato, Paolo ; Pagani, Carlo ; Sertore, Daniele ; Staykov, Lazar ; Tsakov, Ivan ; Sandner, Wolfgang ; Will, Ingo ; Ackermann, Wolfgang ; Cee, Rainer ; Müller, Wolfgang Franz Otto ; Setzer, Stefan ; Weiland, Thomas (2003):
Characterization of the Electron Source at the Photo Injector Test Facility at DESY Zeuthen.
Proceedings of the 25th International Free Electron Laser Conference, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2003
Creators: Hartrott, Michael von ; Jaeschke, Eberhard ; Krämer, Dieter ; Carneiro, Jean-Paul ; Flöttmann, Klaus ; Rossbach, Jörg ; Schreiber, Siegfried ; Abrahamyan, Karen ; Bähr, Jürgen W. ; Bohnet, Ilja ; Gensch, Ulrich ; Grabosch, Hans-Jürgen ; Han, Jang Hui ; Krassilnikov, Mikhail ; Lipka, Dirk ; Miltchev, Velizar ; Oppelt, Anne ; Petrosyan, Bagrat ; Stephan, Frank ; Michelato, Paolo ; Pagani, Carlo ; Sertore, Daniele ; Staykov, Lazar ; Tsakov, Ivan ; Sandner, Wolfgang ; Will, Ingo ; Ackermann, Wolfgang ; Cee, Rainer ; Müller, Wolfgang Franz Otto ; Setzer, Stefan ; Weiland, Thomas
Title: Characterization of the Electron Source at the Photo Injector Test Facility at DESY Zeuthen
Language: English
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory (from 01.01.2019 renamed Institute for Accelerator Science and Electromagnetic Fields)
Event Title: Proceedings of the 25th International Free Electron Laser Conference
Date Deposited: 14 Mar 2016 16:48
Additional Information:

TEMF-Pub-DB TEMF000487

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