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Direct observation of the energetics at a semiconductor/liquid junction by operando X-ray photoelectron spectroscopy

Lichterman, Michael F. and Hu, Shu and Richter, Matthias H. and Crumlin, Ethan J. and Axnanda, Stephanus and Favaro, Marco and Drisdell, Walter and Hussain, Zahid and Mayer, Thomas and Brunschwig, Bruce S. and Lewis, Nathan S. and Liu, Zhi and Lewerenz, Hans-Joachim (2015):
Direct observation of the energetics at a semiconductor/liquid junction by operando X-ray photoelectron spectroscopy.
In: Energy Environ. Sci., 8 (8), pp. 2409-2416, ISSN 1754-5692,
[Online-Edition: http://dx.doi.org/10.1039/c5ee01014d],
[Article]

Item Type: Article
Erschienen: 2015
Creators: Lichterman, Michael F. and Hu, Shu and Richter, Matthias H. and Crumlin, Ethan J. and Axnanda, Stephanus and Favaro, Marco and Drisdell, Walter and Hussain, Zahid and Mayer, Thomas and Brunschwig, Bruce S. and Lewis, Nathan S. and Liu, Zhi and Lewerenz, Hans-Joachim
Title: Direct observation of the energetics at a semiconductor/liquid junction by operando X-ray photoelectron spectroscopy
Language: English
Journal or Publication Title: Energy Environ. Sci.
Volume: 8
Number: 8
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 07 Feb 2016 14:33
Official URL: http://dx.doi.org/10.1039/c5ee01014d
Identification Number: doi:10.1039/c5ee01014d
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