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Preparation, Characterization, and Modeling of Ultrahigh Coercivity Sm-Co Thin Films

Akdogan, O. ; Sepehri-Amin, H. ; Dempsey, N. M. ; Ohkubo, T. ; Hono, K. ; Gutfleisch, O. ; Schrefl, T. ; Givord, D. (2015)
Preparation, Characterization, and Modeling of Ultrahigh Coercivity Sm-Co Thin Films.
In: Advanced Electronic Materials, 1 (5)
doi: 10.1002/aelm.201500009
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

Isotropic Sm–Co thin films with different SmxCoy phases (1:7, 1:5, and 2:7) are prepared by triode sputtering of targets of variable composition. A room-temperature coercivity value of 6.8 T is achieved in the film with the SmCo5 phase. Transmission electron microscopy (TEM) and 3D atom probe analyses of films that comprise this compound reveal the presence of Sm-rich 4-nm-sized precipitates within grains and along grain boundaries. Atomic-resolution scanning transmission electron microscopy/high-resolution high-angle annular dark-field (STEM/HAADF) imaging show that stacking faults occur within SmCo5 grains, which correspond to local phase variants including Sm2Co7, Sm5Co19 and SmCo3. The contribution to domain wall pinning of precipitates and stacking faults, as well as grain boundaries between misaligned grains, is discussed semi-quantitatively. Micromagnetic simulations are carried out to evaluate the influence of stacking faults and grain boundaries on magnetization reversal. The results indicate that the high coercivity values achieved can mainly be attributed to the strong pinning of magnetic domains at the grain boundaries of randomly oriented SmCo5 nanograins.

Typ des Eintrags: Artikel
Erschienen: 2015
Autor(en): Akdogan, O. ; Sepehri-Amin, H. ; Dempsey, N. M. ; Ohkubo, T. ; Hono, K. ; Gutfleisch, O. ; Schrefl, T. ; Givord, D.
Art des Eintrags: Bibliographie
Titel: Preparation, Characterization, and Modeling of Ultrahigh Coercivity Sm-Co Thin Films
Sprache: Englisch
Publikationsjahr: Mai 2015
Verlag: WILEY
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Advanced Electronic Materials
Jahrgang/Volume einer Zeitschrift: 1
(Heft-)Nummer: 5
DOI: 10.1002/aelm.201500009
Kurzbeschreibung (Abstract):

Isotropic Sm–Co thin films with different SmxCoy phases (1:7, 1:5, and 2:7) are prepared by triode sputtering of targets of variable composition. A room-temperature coercivity value of 6.8 T is achieved in the film with the SmCo5 phase. Transmission electron microscopy (TEM) and 3D atom probe analyses of films that comprise this compound reveal the presence of Sm-rich 4-nm-sized precipitates within grains and along grain boundaries. Atomic-resolution scanning transmission electron microscopy/high-resolution high-angle annular dark-field (STEM/HAADF) imaging show that stacking faults occur within SmCo5 grains, which correspond to local phase variants including Sm2Co7, Sm5Co19 and SmCo3. The contribution to domain wall pinning of precipitates and stacking faults, as well as grain boundaries between misaligned grains, is discussed semi-quantitatively. Micromagnetic simulations are carried out to evaluate the influence of stacking faults and grain boundaries on magnetization reversal. The results indicate that the high coercivity values achieved can mainly be attributed to the strong pinning of magnetic domains at the grain boundaries of randomly oriented SmCo5 nanograins.

Freie Schlagworte: Sm-Co, high coercivity, modeling, thin films
Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Funktionale Materialien
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
11 Fachbereich Material- und Geowissenschaften
Hinterlegungsdatum: 08 Jan 2016 09:33
Letzte Änderung: 08 Jan 2016 09:33
PPN:
Sponsoren: This work was partly supported by the EU "Romeo" project and the Magnetic Materials for High-Eficient Motors (MagHEM) project.
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