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Epitaxial growth and control of the sodium content in NaxCoO2 thin films

Hildebrandt, Sandra ; Komissinskiy, Philipp ; Major, Marton ; Donner, Wolfgang ; Alff, Lambert (2013)
Epitaxial growth and control of the sodium content in NaxCoO2 thin films.
In: Thin Solid Films, 545
doi: 10.1016/j.tsf.2013.08.072
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

Single-phase c-axis oriented NaxCoO2 thin films were grown on (001) SrTiO3 single-crystal substrates, using pulsed laser deposition. X-ray diffraction analysis indicates the epitaxial growth of NaxCoO2 thin films in two domains, rotated in-plane by 15 and 45 degrees relative to [100] SrTiO3. The sodium stoichiometry x of the films can be controlled in a range of 0.38 < x < 0.84 by in-situ post-deposition annealing the NaxCoO2 films at 720 – 760 °C in oxygen for 10 – 30 min. γ - NaxCoO2 films are obtained with a full width at half maximum of the (002) NaxCoO2 rocking curve below 0.2 degrees. The post-deposition annealing can substitute commonly used chemical deintercalation of Na which is typically associated with a loss in crystallinity.

Typ des Eintrags: Artikel
Erschienen: 2013
Autor(en): Hildebrandt, Sandra ; Komissinskiy, Philipp ; Major, Marton ; Donner, Wolfgang ; Alff, Lambert
Art des Eintrags: Bibliographie
Titel: Epitaxial growth and control of the sodium content in NaxCoO2 thin films
Sprache: Englisch
Publikationsjahr: 31 Oktober 2013
Verlag: Elsevier Science Publishing
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Thin Solid Films
Jahrgang/Volume einer Zeitschrift: 545
DOI: 10.1016/j.tsf.2013.08.072
Kurzbeschreibung (Abstract):

Single-phase c-axis oriented NaxCoO2 thin films were grown on (001) SrTiO3 single-crystal substrates, using pulsed laser deposition. X-ray diffraction analysis indicates the epitaxial growth of NaxCoO2 thin films in two domains, rotated in-plane by 15 and 45 degrees relative to [100] SrTiO3. The sodium stoichiometry x of the films can be controlled in a range of 0.38 < x < 0.84 by in-situ post-deposition annealing the NaxCoO2 films at 720 – 760 °C in oxygen for 10 – 30 min. γ - NaxCoO2 films are obtained with a full width at half maximum of the (002) NaxCoO2 rocking curve below 0.2 degrees. The post-deposition annealing can substitute commonly used chemical deintercalation of Na which is typically associated with a loss in crystallinity.

Freie Schlagworte: NaxCoO2 thin films, Epitaxial relation on (001) SrTiO3, Control of sodium content, Pulsed laser deposition
Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Dünne Schichten
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Strukturforschung
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
11 Fachbereich Material- und Geowissenschaften
Hinterlegungsdatum: 09 Jan 2014 09:09
Letzte Änderung: 09 Jan 2014 09:09
PPN:
Sponsoren: This study was supported by the AL560/6-1 project of the Deutsche Forschungsgemeinschaft.
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