Hildebrandt, Sandra ; Komissinskiy, Philipp ; Major, Marton ; Donner, Wolfgang ; Alff, Lambert (2013)
Epitaxial growth and control of the sodium content in NaxCoO2 thin films.
In: Thin Solid Films, 545
doi: 10.1016/j.tsf.2013.08.072
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Single-phase c-axis oriented NaxCoO2 thin films were grown on (001) SrTiO3 single-crystal substrates, using pulsed laser deposition. X-ray diffraction analysis indicates the epitaxial growth of NaxCoO2 thin films in two domains, rotated in-plane by 15 and 45 degrees relative to [100] SrTiO3. The sodium stoichiometry x of the films can be controlled in a range of 0.38 < x < 0.84 by in-situ post-deposition annealing the NaxCoO2 films at 720 – 760 °C in oxygen for 10 – 30 min. γ - NaxCoO2 films are obtained with a full width at half maximum of the (002) NaxCoO2 rocking curve below 0.2 degrees. The post-deposition annealing can substitute commonly used chemical deintercalation of Na which is typically associated with a loss in crystallinity.
Typ des Eintrags: | Artikel |
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Erschienen: | 2013 |
Autor(en): | Hildebrandt, Sandra ; Komissinskiy, Philipp ; Major, Marton ; Donner, Wolfgang ; Alff, Lambert |
Art des Eintrags: | Bibliographie |
Titel: | Epitaxial growth and control of the sodium content in NaxCoO2 thin films |
Sprache: | Englisch |
Publikationsjahr: | 31 Oktober 2013 |
Verlag: | Elsevier Science Publishing |
Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Thin Solid Films |
Jahrgang/Volume einer Zeitschrift: | 545 |
DOI: | 10.1016/j.tsf.2013.08.072 |
Kurzbeschreibung (Abstract): | Single-phase c-axis oriented NaxCoO2 thin films were grown on (001) SrTiO3 single-crystal substrates, using pulsed laser deposition. X-ray diffraction analysis indicates the epitaxial growth of NaxCoO2 thin films in two domains, rotated in-plane by 15 and 45 degrees relative to [100] SrTiO3. The sodium stoichiometry x of the films can be controlled in a range of 0.38 < x < 0.84 by in-situ post-deposition annealing the NaxCoO2 films at 720 – 760 °C in oxygen for 10 – 30 min. γ - NaxCoO2 films are obtained with a full width at half maximum of the (002) NaxCoO2 rocking curve below 0.2 degrees. The post-deposition annealing can substitute commonly used chemical deintercalation of Na which is typically associated with a loss in crystallinity. |
Freie Schlagworte: | NaxCoO2 thin films, Epitaxial relation on (001) SrTiO3, Control of sodium content, Pulsed laser deposition |
Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Dünne Schichten 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Strukturforschung 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften |
Hinterlegungsdatum: | 09 Jan 2014 09:09 |
Letzte Änderung: | 09 Jan 2014 09:09 |
PPN: | |
Sponsoren: | This study was supported by the AL560/6-1 project of the Deutsche Forschungsgemeinschaft. |
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