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Sputter deposition of indium tin oxide onto zinc pthalocyanine: Chemical and electronic properties of the interface studied by photoelectron spectroscopy

Gassmann, Jürgen and Broetz, Joachim and Klein, Andreas (2012):
Sputter deposition of indium tin oxide onto zinc pthalocyanine: Chemical and electronic properties of the interface studied by photoelectron spectroscopy.
In: Applied Surface Science, Elsevier Science Publishing, pp. 3913-3919, 258, (8), ISSN 01694332,
[Online-Edition: http://dx.doi.org/10.1016/j.apsusc.2011.12.062],
[Article]

Abstract

The interface chemistry and the energy band alignment at the interface formed during sputter deposition of transparent conducting indium tin oxide (ITO) onto the organic semiconductor zinc phtalocyanine (ZnPc), which is important for inverted, transparent, and stacked organic light emitting diodes, is studied by in situ photoelectron spectroscopy (XPS and UPS). ITO was sputtered at room temperature and a low power density with a face to face arrangement of the target and substrate. With these deposition conditions, no chemical reaction and a low barrier height for charge injection at this interface are observed. The barrier height is comparable to those observed for the reverse deposition sequence, which also confirms the absence of sputter damage.

Item Type: Article
Erschienen: 2012
Creators: Gassmann, Jürgen and Broetz, Joachim and Klein, Andreas
Title: Sputter deposition of indium tin oxide onto zinc pthalocyanine: Chemical and electronic properties of the interface studied by photoelectron spectroscopy
Language: English
Abstract:

The interface chemistry and the energy band alignment at the interface formed during sputter deposition of transparent conducting indium tin oxide (ITO) onto the organic semiconductor zinc phtalocyanine (ZnPc), which is important for inverted, transparent, and stacked organic light emitting diodes, is studied by in situ photoelectron spectroscopy (XPS and UPS). ITO was sputtered at room temperature and a low power density with a face to face arrangement of the target and substrate. With these deposition conditions, no chemical reaction and a low barrier height for charge injection at this interface are observed. The barrier height is comparable to those observed for the reverse deposition sequence, which also confirms the absence of sputter damage.

Journal or Publication Title: Applied Surface Science
Volume: 258
Number: 8
Publisher: Elsevier Science Publishing
Uncontrolled Keywords: Indium tin oxide (ITO), Zinc phtalocyanine (ZnPc), Photoelectron spectroscopy, Magnetron sputtering, Energy band alignment, Inverted OLED
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Surface Science
11 Department of Materials and Earth Sciences > Material Science > Structure Research
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences
Date Deposited: 28 Nov 2013 09:11
Official URL: http://dx.doi.org/10.1016/j.apsusc.2011.12.062
Identification Number: doi:10.1016/j.apsusc.2011.12.062
Funders: This work was supported by the German Federal Ministry for Education and Research (BMBF) under contract no. FKZ 13N10474 (TOPAS).
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