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A flatbed scanner for large-area thickness determination of ultra-thin layers in printed electronics

Bornemann, Nils and Dörsam, Edgar :
A flatbed scanner for large-area thickness determination of ultra-thin layers in printed electronics.
[Online-Edition: http://dx.doi.org/10.1364/oe.21.021897]
In: Optics Express, 21 (19) pp. 21897-21911. ISSN 1094-4087
[Article] , (2013)

Official URL: http://dx.doi.org/10.1364/oe.21.021897
Item Type: Article
Erschienen: 2013
Creators: Bornemann, Nils and Dörsam, Edgar
Title: A flatbed scanner for large-area thickness determination of ultra-thin layers in printed electronics
Language: English
Journal or Publication Title: Optics Express
Volume: 21
Number: 19
Divisions: 16 Department of Mechanical Engineering
16 Department of Mechanical Engineering > Institute of Printing Science and Technology (IDD)
DFG-Collaborative Research Centres (incl. Transregio)
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres
Exzellenzinitiative
Exzellenzinitiative > Clusters of Excellence
Zentrale Einrichtungen
Exzellenzinitiative > Clusters of Excellence > Center of Smart Interfaces (CSI)
Date Deposited: 11 Sep 2013 08:07
Official URL: http://dx.doi.org/10.1364/oe.21.021897
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