Seggern, Heinz von (1978)
Thermal-pulse technique for determining charge distributions: Effect of measurement accuracy.
In: Applied Physics Letters, 33 (2)
doi: 10.1063/1.90282
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
We examine how the thermal-pulse technique for determining spatial charge distribution in charged polymer foils is affected by inaccuracies of the measuring process. A theoretical model is developed for thermal equalization processes which is in agreement with the measured temperature transients. Using this model, we show by computer simulation that even for a measurement inaccuracy of less than 1 % the obtainable information consists of only the first moment of the charge distribution and the first few Fourier coefficients.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 1978 |
| Autor(en): | Seggern, Heinz von |
| Art des Eintrags: | Bibliographie |
| Titel: | Thermal-pulse technique for determining charge distributions: Effect of measurement accuracy |
| Sprache: | Englisch |
| Publikationsjahr: | 15 Juli 1978 |
| Verlag: | American Institute of Physics Publishing |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Applied Physics Letters |
| Jahrgang/Volume einer Zeitschrift: | 33 |
| (Heft-)Nummer: | 2 |
| DOI: | 10.1063/1.90282 |
| Kurzbeschreibung (Abstract): | We examine how the thermal-pulse technique for determining spatial charge distribution in charged polymer foils is affected by inaccuracies of the measuring process. A theoretical model is developed for thermal equalization processes which is in agreement with the measured temperature transients. Using this model, we show by computer simulation that even for a measurement inaccuracy of less than 1 % the obtainable information consists of only the first moment of the charge distribution and the first few Fourier coefficients. |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Elektronische Materialeigenschaften |
| Hinterlegungsdatum: | 13 Jun 2013 07:23 |
| Letzte Änderung: | 13 Aug 2021 14:08 |
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