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Nanoelectronic properties of a model system and of a conjugated polymer: A study by Kelvin probe force microscopy and scanning conductive torsion mode microscopy

Sun, L. and Wang, J. J. and Bonaccurso, E. (2010):
Nanoelectronic properties of a model system and of a conjugated polymer: A study by Kelvin probe force microscopy and scanning conductive torsion mode microscopy.
114, In: J. Phys. Chem. C , p. 7161, [Article]

Item Type: Article
Erschienen: 2010
Creators: Sun, L. and Wang, J. J. and Bonaccurso, E.
Title: Nanoelectronic properties of a model system and of a conjugated polymer: A study by Kelvin probe force microscopy and scanning conductive torsion mode microscopy
Language: English
Journal or Publication Title: J. Phys. Chem. C
Volume: 114
Divisions: Zentrale Einrichtungen
UNSPECIFIED
Exzellenzinitiative > Clusters of Excellence > Center of Smart Interfaces (CSI)
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Exzellenzinitiative
Exzellenzinitiative > Clusters of Excellence
Date Deposited: 11 Mar 2013 13:11
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