Nikolaenko, Yu. M. ; Medvedev, Yu. V. ; Ghafari, M. ; Hahn, H. ; Chukanova, I. N. (2006)
Thermal boundary resistance of a granular film-substrate interface.
In: Technical Physics Letters, 32 (10)
doi: 10.1134/S1063785006100269
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
The results of measurements of the thermal boundary resistance (RFS) of the interface between a one-layer granular film on a substrate are presented, which reveal the relationship between the RFS value and the grain size in the film material. For a 10-nm-thick nanocrystalline (Fe0.5Co0.5)0.4Cu0.6 film deposited on a silicon substrate with a 50-nm-thick SiO2 oxide layer (interlayer), RFS is increased by almost two orders of magnitude compared to the minimum reported value (10 –7(m2K)/W). The thermal boundary resistance of a La0.65Ca0.35MnO3 film with a microcrystalline structure, which was deposited over a YBa2Cu3O7 –δinterlayer on a SrTiO3 substrate, is RFS = 10–6(m2K)/W.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2006 |
| Autor(en): | Nikolaenko, Yu. M. ; Medvedev, Yu. V. ; Ghafari, M. ; Hahn, H. ; Chukanova, I. N. |
| Art des Eintrags: | Bibliographie |
| Titel: | Thermal boundary resistance of a granular film-substrate interface |
| Sprache: | Englisch |
| Publikationsjahr: | 1 Oktober 2006 |
| Verlag: | Nauka/Interperiodica |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Technical Physics Letters |
| Jahrgang/Volume einer Zeitschrift: | 32 |
| (Heft-)Nummer: | 10 |
| DOI: | 10.1134/S1063785006100269 |
| Kurzbeschreibung (Abstract): | The results of measurements of the thermal boundary resistance (RFS) of the interface between a one-layer granular film on a substrate are presented, which reveal the relationship between the RFS value and the grain size in the film material. For a 10-nm-thick nanocrystalline (Fe0.5Co0.5)0.4Cu0.6 film deposited on a silicon substrate with a 50-nm-thick SiO2 oxide layer (interlayer), RFS is increased by almost two orders of magnitude compared to the minimum reported value (10 –7(m2K)/W). The thermal boundary resistance of a La0.65Ca0.35MnO3 film with a microcrystalline structure, which was deposited over a YBa2Cu3O7 –δinterlayer on a SrTiO3 substrate, is RFS = 10–6(m2K)/W. |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Gemeinschaftslabor Nanomaterialien 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften |
| Hinterlegungsdatum: | 13 Feb 2013 10:08 |
| Letzte Änderung: | 05 Mär 2013 10:05 |
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