Gottschalk, Sebastian ; Hahn, Horst ; Balogh, Adam G. ; Puff, Werner ; Kungl, Hans ; Hoffmann, Michael J. (2004)
A positron lifetime study of lanthanum and niobium doped Pb(Zr[sub 0.6]Ti[sub 0.4])O[sub 3].
In: Journal of Applied Physics, 96 (12)
doi: 10.1063/1.1810198
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
A study of vacancy-related defects in lanthanum and niobium doped PbZr0.6Ti0.4O3 with dopant concentrations of 0–6 and 0–4 mol%, respectively has been performed using positron annihilation spectroscopy X-ray diffraction, and photoelectron spectroscopy. Positron lifetime as well as coincidence annihilation radiation Doppler line broadening measurements were carried out. It was found that the samples exhibit vacancylike defects that act as positron traps. Two main defect lifetime components were found in both sample sets one at <150 ps and one at <300 ps. These defect trapping sites can be attributed to single oxygen vacancies and A-site vacancies, respectively. Doppler line broadening measurements, however, do not show significant changes as a function of dopant concentrations in terms of shape S and wing W parameters.
Typ des Eintrags: | Artikel |
---|---|
Erschienen: | 2004 |
Autor(en): | Gottschalk, Sebastian ; Hahn, Horst ; Balogh, Adam G. ; Puff, Werner ; Kungl, Hans ; Hoffmann, Michael J. |
Art des Eintrags: | Bibliographie |
Titel: | A positron lifetime study of lanthanum and niobium doped Pb(Zr[sub 0.6]Ti[sub 0.4])O[sub 3] |
Sprache: | Englisch |
Publikationsjahr: | 15 Dezember 2004 |
Verlag: | American Institute of Physics |
Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Journal of Applied Physics |
Jahrgang/Volume einer Zeitschrift: | 96 |
(Heft-)Nummer: | 12 |
DOI: | 10.1063/1.1810198 |
Kurzbeschreibung (Abstract): | A study of vacancy-related defects in lanthanum and niobium doped PbZr0.6Ti0.4O3 with dopant concentrations of 0–6 and 0–4 mol%, respectively has been performed using positron annihilation spectroscopy X-ray diffraction, and photoelectron spectroscopy. Positron lifetime as well as coincidence annihilation radiation Doppler line broadening measurements were carried out. It was found that the samples exhibit vacancylike defects that act as positron traps. Two main defect lifetime components were found in both sample sets one at <150 ps and one at <300 ps. These defect trapping sites can be attributed to single oxygen vacancies and A-site vacancies, respectively. Doppler line broadening measurements, however, do not show significant changes as a function of dopant concentrations in terms of shape S and wing W parameters. |
Freie Schlagworte: | lead compounds, lanthanum, niobium, ferroelectric materials, positron annihilation, impurity-vacancy interactions, vacancies (crystal), impurity distribution, Doppler broadening, sintering, X-ray photoelectron spectra, X-ray diffraction |
Zusätzliche Informationen: | SFB 595 (Electric Fatigue In Functional Materials) |
Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialanalytik 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Gemeinschaftslabor Nanomaterialien DFG-Sonderforschungsbereiche (inkl. Transregio) DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche Zentrale Einrichtungen DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > A - Synthese DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > A - Synthese > Teilprojekt A2: Herstellung und Charakterisierung von PZT-Keramiken mit definierter Defektchemie DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > B - Charakterisierung DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > B - Charakterisierung > Teilprojekt B2: Untersuchung der Defektstruktur und Diffusion in ferroelektrischen Materialien |
Hinterlegungsdatum: | 08 Feb 2013 08:20 |
Letzte Änderung: | 30 Jan 2019 10:38 |
PPN: | |
Sponsoren: | The authors gratefully acknowledge the financial support by German Research Foundation (DFG) within the frame of the Center of Excellence SFB 595 (Electric Fatigue In Functional Materials) Project. |
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