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Discriminant analysis and secondary-beam charge recognition

Łukasik, J. and Adrich, P. and Aumann, T. and Bacri, C. O. and Barczyk, T. and Bassini, R. and Bianchin, S. and Boiano, C. and Botvina, A. S. and Boudard, A. and Brzychczyk, J. and Chbihi, A. and Cibor, J. and Czech, B. and Ducret, J.-É. and Emling, H. and Frankland, J. and Hellström, M. and Henzlova, D. and Immè, G. and Iori, I. and Johansson, H. and Kezzar, K. and Lafriakh, A. and Le Fèvre, A. and Le Gentil, E. and Leifels, Y. and Lühning, J. and Lynch, W. G. and Lynen, U. and Majka, Z. and Mocko, M. and Müller, W. F. J. and Mykulyak, A. and De Napoli, M. and Orth, H. and Otte, A. N. and Palit, R. and Pawłowski, P. and Pullia, A. and Raciti, G. and Rapisarda, E. and Sann, H. and Schwarz, C. and Sfienti, C. and Simon, H. and Sümmerer, K. and Trautmann, W. and Tsang, M. B. and Verde, G. and Volant, C. and Wallace, M. and Weick, H. and Wiechula, J. and Wieloch, A. and Zwiegliński, B. (2008):
Discriminant analysis and secondary-beam charge recognition.
In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, p. 413, 587, (2-3), ISSN 01689002, [Online-Edition: http://dx.doi.org/10.1016/j.nima.2008.01.071],
[Article]

Item Type: Article
Erschienen: 2008
Creators: Łukasik, J. and Adrich, P. and Aumann, T. and Bacri, C. O. and Barczyk, T. and Bassini, R. and Bianchin, S. and Boiano, C. and Botvina, A. S. and Boudard, A. and Brzychczyk, J. and Chbihi, A. and Cibor, J. and Czech, B. and Ducret, J.-É. and Emling, H. and Frankland, J. and Hellström, M. and Henzlova, D. and Immè, G. and Iori, I. and Johansson, H. and Kezzar, K. and Lafriakh, A. and Le Fèvre, A. and Le Gentil, E. and Leifels, Y. and Lühning, J. and Lynch, W. G. and Lynen, U. and Majka, Z. and Mocko, M. and Müller, W. F. J. and Mykulyak, A. and De Napoli, M. and Orth, H. and Otte, A. N. and Palit, R. and Pawłowski, P. and Pullia, A. and Raciti, G. and Rapisarda, E. and Sann, H. and Schwarz, C. and Sfienti, C. and Simon, H. and Sümmerer, K. and Trautmann, W. and Tsang, M. B. and Verde, G. and Volant, C. and Wallace, M. and Weick, H. and Wiechula, J. and Wieloch, A. and Zwiegliński, B.
Title: Discriminant analysis and secondary-beam charge recognition
Language: English
Journal or Publication Title: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume: 587
Number: 2-3
Divisions: 05 Department of Physics > Institute of Nuclear Physics
05 Department of Physics
Date Deposited: 29 Jan 2013 16:13
Official URL: http://dx.doi.org/10.1016/j.nima.2008.01.071
Identification Number: doi:10.1016/j.nima.2008.01.071
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