Flege, S. (2012)
Comment on: “Corrosion behaviour of low energy, high temperature nitrogen ion-implanted AISI 304 stainless steel”.
In: Pramana, 78 (2)
doi: 10.1007/s12043-011-0228-7
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Ghoranneviss et al [1] have reported on nitrogen implantation into stainless steel and presented a secondary ion mass spectrometry (SIMS) measurement of the N and the CrN intensities with sputter time in figure 2. The experimental part described the measurement conditions, mentioning that Cs+ primary ions were used and negative secondary ions were detected. A difference in the distribution of the CrN and the alleged N signal was observed and attributed to CrN acting as a diffusion barrier for nitrogen diffusion. It may be noted here that nitrogen does not form stable elemental negative ions [2] and is thus not detectable in SIMS measurements as N− [3]. Hence the signal with a mass-to-charge ratio of 14 is most likely some interference but definitely not nitrogen.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2012 |
| Autor(en): | Flege, S. |
| Art des Eintrags: | Bibliographie |
| Titel: | Comment on: “Corrosion behaviour of low energy, high temperature nitrogen ion-implanted AISI 304 stainless steel” |
| Sprache: | Englisch |
| Publikationsjahr: | 1 Februar 2012 |
| Verlag: | Springer-Verlag |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Pramana |
| Jahrgang/Volume einer Zeitschrift: | 78 |
| (Heft-)Nummer: | 2 |
| DOI: | 10.1007/s12043-011-0228-7 |
| Kurzbeschreibung (Abstract): | Ghoranneviss et al [1] have reported on nitrogen implantation into stainless steel and presented a secondary ion mass spectrometry (SIMS) measurement of the N and the CrN intensities with sputter time in figure 2. The experimental part described the measurement conditions, mentioning that Cs+ primary ions were used and negative secondary ions were detected. A difference in the distribution of the CrN and the alleged N signal was observed and attributed to CrN acting as a diffusion barrier for nitrogen diffusion. It may be noted here that nitrogen does not form stable elemental negative ions [2] and is thus not detectable in SIMS measurements as N− [3]. Hence the signal with a mass-to-charge ratio of 14 is most likely some interference but definitely not nitrogen. |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialanalytik |
| Hinterlegungsdatum: | 14 Jan 2013 09:57 |
| Letzte Änderung: | 17 Sep 2018 12:28 |
| PPN: | |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
 |
Frage zum Eintrag |
Optionen (nur für Redakteure)
 |
Redaktionelle Details anzeigen |
Drucken
Impressum