Gottschalk, S. ; Hahn, H. ; Flege, S. ; Balogh, A. G. (2008)
Oxygen vacancy kinetics in ferroelectric PbZr[sub 0.4]Ti[sub 0.6]O[sub 3].
In: Journal of Applied Physics, 104 (11)
doi: 10.1063/1.2988902
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Oxygen vacancy kinetics in ferroelectric PbZr0.4Ti0.6O3 were studied by 18oxygen (18O) tracer self-diffusion in epitaxial thin films as well as bulk polycrystalline samples. 18O exchange annealing was carried out at an oxygen partial pressure of 250 mbar and temperatures between 250 and 400 °C. Isotope depth profiling was performed by secondary ion mass spectrometry as well as neutral secondary mass spectrometry. The observed concentration depth profiles of the polycrystalline samples show two distinct diffusion paths, namely, bulk diffusion and grain boundary (GB) diffusion. It appears to be of type B-kinetics in the investigated temperature range, with DGB/Dbulk⪢100. Donor doped samples with different levels of Nb5+ (1–4 mol. %) were also investigated. The effect on the diffusion depth profiles, however, were negligible and can solely be attributed due to the change in the samples microstructure as induced by the dopants. A diffusion coefficient for the bulk diffusion of the 18O isotope, Dbulk = 10±5×10−8 cm2/s exp(−0.87±0.1 eV/kT) was found. The faster GB diffusion process shows an activation enthalpy of only EA = 0.66±0.2 eV.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2008 |
| Autor(en): | Gottschalk, S. ; Hahn, H. ; Flege, S. ; Balogh, A. G. |
| Art des Eintrags: | Bibliographie |
| Titel: | Oxygen vacancy kinetics in ferroelectric PbZr[sub 0.4]Ti[sub 0.6]O[sub 3] |
| Sprache: | Englisch |
| Publikationsjahr: | 5 Dezember 2008 |
| Verlag: | American Institute of Physics |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Journal of Applied Physics |
| Jahrgang/Volume einer Zeitschrift: | 104 |
| (Heft-)Nummer: | 11 |
| DOI: | 10.1063/1.2988902 |
| Kurzbeschreibung (Abstract): | Oxygen vacancy kinetics in ferroelectric PbZr0.4Ti0.6O3 were studied by 18oxygen (18O) tracer self-diffusion in epitaxial thin films as well as bulk polycrystalline samples. 18O exchange annealing was carried out at an oxygen partial pressure of 250 mbar and temperatures between 250 and 400 °C. Isotope depth profiling was performed by secondary ion mass spectrometry as well as neutral secondary mass spectrometry. The observed concentration depth profiles of the polycrystalline samples show two distinct diffusion paths, namely, bulk diffusion and grain boundary (GB) diffusion. It appears to be of type B-kinetics in the investigated temperature range, with DGB/Dbulk⪢100. Donor doped samples with different levels of Nb5+ (1–4 mol. %) were also investigated. The effect on the diffusion depth profiles, however, were negligible and can solely be attributed due to the change in the samples microstructure as induced by the dopants. A diffusion coefficient for the bulk diffusion of the 18O isotope, Dbulk = 10±5×10−8 cm2/s exp(−0.87±0.1 eV/kT) was found. The faster GB diffusion process shows an activation enthalpy of only EA = 0.66±0.2 eV. |
| Freie Schlagworte: | annealing, enthalpy, epitaxial layers, ferroelectric thin films, grain boundary diffusion, lead compounds, self-diffusion, vacancies (crystal), zirconium compounds |
| Zusätzliche Informationen: | SFB 595 B2 |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialanalytik 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Gemeinschaftslabor Nanomaterialien DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > B - Charakterisierung > Teilprojekt B2: Untersuchung der Defektstruktur und Diffusion in ferroelektrischen Materialien DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > B - Charakterisierung DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung Zentrale Einrichtungen DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche DFG-Sonderforschungsbereiche (inkl. Transregio) |
| Hinterlegungsdatum: | 10 Dez 2012 09:06 |
| Letzte Änderung: | 12 Mär 2015 12:04 |
| PPN: | |
| Sponsoren: | Financial support by the Deutsche Forschungsgemeinschaft (DFG) in the framework of Sonderforschungsbereich (SFB) Grant No. 595 is highly appreciated. |
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