TU Darmstadt / ULB / TUbiblio

High-Energy Synchrotron X-Ray Diffraction for In Situ Diffuse Scattering Studies of Bulk Single Crystals

Daniels, John E. and Jo, Wook and Donner, Wolfgang (2012):
High-Energy Synchrotron X-Ray Diffraction for In Situ Diffuse Scattering Studies of Bulk Single Crystals.
In: JOM, pp. 174-180, 64, (1), ISSN 1047-4838, [Online-Edition: http://dx.doi.org/10.1007/s11837-011-0230-z],
[Article]

Abstract

High-energy synchrotron x-ray scattering offers a powerful technique for investigation of single-crystal material structures. Large, mm-sized crystals can be used, allowing complex in situ sample environments to be employed. Here, we demonstrate how this technique can be applied for the collection of single-crystal diffuse scattering volumes from the electro-active material 96%Bi0.5Na0.5TiO3-4%BaTiO3 while electric fields are applied in situ. The data obtained allow correlation of the atomic and nanoscale structures with the observed macroscopic electro-active properties of interest. This article presents a recent study relating the nanoscale stacking fault structure in BNT-BT to the relaxor-ferroelectric nature of the material [Daniels et al. in Appl. Phys. Lett. 98, 252904 (2011)], and extends this study with further experimental description and analysis.

Item Type: Article
Erschienen: 2012
Creators: Daniels, John E. and Jo, Wook and Donner, Wolfgang
Title: High-Energy Synchrotron X-Ray Diffraction for In Situ Diffuse Scattering Studies of Bulk Single Crystals
Language: English
Abstract:

High-energy synchrotron x-ray scattering offers a powerful technique for investigation of single-crystal material structures. Large, mm-sized crystals can be used, allowing complex in situ sample environments to be employed. Here, we demonstrate how this technique can be applied for the collection of single-crystal diffuse scattering volumes from the electro-active material 96%Bi0.5Na0.5TiO3-4%BaTiO3 while electric fields are applied in situ. The data obtained allow correlation of the atomic and nanoscale structures with the observed macroscopic electro-active properties of interest. This article presents a recent study relating the nanoscale stacking fault structure in BNT-BT to the relaxor-ferroelectric nature of the material [Daniels et al. in Appl. Phys. Lett. 98, 252904 (2011)], and extends this study with further experimental description and analysis.

Journal or Publication Title: JOM
Volume: 64
Number: 1
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Nonmetallic-Inorganic Materials
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences
Date Deposited: 29 Feb 2012 13:57
Official URL: http://dx.doi.org/10.1007/s11837-011-0230-z
Identification Number: doi:10.1007/s11837-011-0230-z
Export:

Optionen (nur für Redakteure)

View Item View Item