Daniels, John E. ; Jo, Wook ; Donner, Wolfgang (2012)
High-Energy Synchrotron X-Ray Diffraction for In Situ Diffuse Scattering Studies of Bulk Single Crystals.
In: JOM, 64 (1)
doi: 10.1007/s11837-011-0230-z
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
High-energy synchrotron x-ray scattering offers a powerful technique for investigation of single-crystal material structures. Large, mm-sized crystals can be used, allowing complex in situ sample environments to be employed. Here, we demonstrate how this technique can be applied for the collection of single-crystal diffuse scattering volumes from the electro-active material 96%Bi0.5Na0.5TiO3-4%BaTiO3 while electric fields are applied in situ. The data obtained allow correlation of the atomic and nanoscale structures with the observed macroscopic electro-active properties of interest. This article presents a recent study relating the nanoscale stacking fault structure in BNT-BT to the relaxor-ferroelectric nature of the material [Daniels et al. in Appl. Phys. Lett. 98, 252904 (2011)], and extends this study with further experimental description and analysis.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2012 |
| Autor(en): | Daniels, John E. ; Jo, Wook ; Donner, Wolfgang |
| Art des Eintrags: | Bibliographie |
| Titel: | High-Energy Synchrotron X-Ray Diffraction for In Situ Diffuse Scattering Studies of Bulk Single Crystals |
| Sprache: | Englisch |
| Publikationsjahr: | 8 Februar 2012 |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | JOM |
| Jahrgang/Volume einer Zeitschrift: | 64 |
| (Heft-)Nummer: | 1 |
| DOI: | 10.1007/s11837-011-0230-z |
| Kurzbeschreibung (Abstract): | High-energy synchrotron x-ray scattering offers a powerful technique for investigation of single-crystal material structures. Large, mm-sized crystals can be used, allowing complex in situ sample environments to be employed. Here, we demonstrate how this technique can be applied for the collection of single-crystal diffuse scattering volumes from the electro-active material 96%Bi0.5Na0.5TiO3-4%BaTiO3 while electric fields are applied in situ. The data obtained allow correlation of the atomic and nanoscale structures with the observed macroscopic electro-active properties of interest. This article presents a recent study relating the nanoscale stacking fault structure in BNT-BT to the relaxor-ferroelectric nature of the material [Daniels et al. in Appl. Phys. Lett. 98, 252904 (2011)], and extends this study with further experimental description and analysis. |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Nichtmetallisch-Anorganische Werkstoffe 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften |
| Hinterlegungsdatum: | 29 Feb 2012 13:57 |
| Letzte Änderung: | 05 Mär 2013 09:59 |
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