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Molecular dynamics study of defect formation in GaN cascades

Nord, J. ; Nordlund, K. ; Keinonen, J. ; Albe, K. (2003)
Molecular dynamics study of defect formation in GaN cascades.
In: Nucl. Instr. Meth. B, 202
doi: 10.1016/S0168-583X(02)01839-6
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

Simulations of irradiation effects in compound semiconductors require interatomic potentials which describe not only the compound phases, but also the pure constituents and defects. We discuss a systematic approach based on the analytic bond-order scheme for constructing such potentials and give an example for GaN. Finally, this potential is employed for simulations of defect formation in GaN by ion irradiation for recoils in the 200 eV to 10 keV energy range. Results on the total damage production are presented and compared with other semiconductors and experiments. (C) 2002 Elsevier Science B.V. All rights reserved.

Typ des Eintrags: Artikel
Erschienen: 2003
Autor(en): Nord, J. ; Nordlund, K. ; Keinonen, J. ; Albe, K.
Art des Eintrags: Bibliographie
Titel: Molecular dynamics study of defect formation in GaN cascades
Sprache: Englisch
Publikationsjahr: April 2003
Verlag: Elsevier Science Publishing Company
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Nucl. Instr. Meth. B
Jahrgang/Volume einer Zeitschrift: 202
DOI: 10.1016/S0168-583X(02)01839-6
URL / URN: http://www.sciencedirect.com/science/article/pii/S0168583X02...
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Kurzbeschreibung (Abstract):

Simulations of irradiation effects in compound semiconductors require interatomic potentials which describe not only the compound phases, but also the pure constituents and defects. We discuss a systematic approach based on the analytic bond-order scheme for constructing such potentials and give an example for GaN. Finally, this potential is employed for simulations of defect formation in GaN by ion irradiation for recoils in the 200 eV to 10 keV energy range. Results on the total damage production are presented and compared with other semiconductors and experiments. (C) 2002 Elsevier Science B.V. All rights reserved.

Freie Schlagworte: Irradiation. Defects, Semiconductors, GaN
Zusätzliche Informationen:

6th International Conference on Computer Simulation of Radiation Effects in Solids

Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialmodellierung
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
11 Fachbereich Material- und Geowissenschaften
Hinterlegungsdatum: 22 Feb 2012 10:55
Letzte Änderung: 05 Mär 2013 09:58
PPN:
Sponsoren: The research was supported by the Academy of Finland under project Nos. 44215 and 73722., Additional travel fundings of the DAAD and the Academy of Finland as well as Grants for computer time from the Center for Scientific Computing in Espoo, Finland are gratefully acknowledged.
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