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Characterization and impedance matching of new high sensitive planar Schottky detector diodes

Hoefle, Matthias and Schneider, Katharina and Penirschke, Andreas and Cojocari, Oleg and Jakoby, Rolf :
Characterization and impedance matching of new high sensitive planar Schottky detector diodes.
In: German Microwave Conference (GeMIC) 2011.
[Conference or Workshop Item] , (2011)

Abstract

New high sensitive zero-bias Schottky detector diodes with low junction capacitance and differential resistance are characterized by applying DC and S-parameter measurements in W-band. The extracted parameters provide an accurate RF model for circuit simulations to design and realize an impedance matching network at 90 GHz to avoid standing waves in a diode detector as an essential part of high sensitive direct detection receivers.

Item Type: Conference or Workshop Item
Erschienen: 2011
Creators: Hoefle, Matthias and Schneider, Katharina and Penirschke, Andreas and Cojocari, Oleg and Jakoby, Rolf
Title: Characterization and impedance matching of new high sensitive planar Schottky detector diodes
Language: English
Abstract:

New high sensitive zero-bias Schottky detector diodes with low junction capacitance and differential resistance are characterized by applying DC and S-parameter measurements in W-band. The extracted parameters provide an accurate RF model for circuit simulations to design and realize an impedance matching network at 90 GHz to avoid standing waves in a diode detector as an essential part of high sensitive direct detection receivers.

Divisions: 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics > Microwave Engineering
18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics
Event Title: German Microwave Conference (GeMIC) 2011
Date Deposited: 27 Jan 2012 15:20
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