Puentes, M. ; Schuessler, M. ; Damm, C. ; Jakoby, Rolf (2011)
Extraction of Capacitive Profiles with a Planar Metamaterial Sensor.
In: Applied Physics A, 103 (3)
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
The extraction of capacitive profiles with a planar metamaterial sensor is presented. The sensor is build up using a tailored Composite right/left-handed transmission line (CRLH-TL). The capacitance values along the line can be evaluated by measuring the broadband line input impedance followed by applying a dedicated extraction method based on classical network synthesis with a combination of the Cauer canonical forms (CCF) I and II to obtain the values of the corresponding lumped elements in the equivalent circuit. Two prototype sensors have been developed and tested to prove the concept. The areas of application of these types of sensors are transportation of materials in industrial processes where the position of the Material Under Test (MUT) is of interest and can be derived from the changes in the capacitances.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2011 |
| Autor(en): | Puentes, M. ; Schuessler, M. ; Damm, C. ; Jakoby, Rolf |
| Art des Eintrags: | Bibliographie |
| Titel: | Extraction of Capacitive Profiles with a Planar Metamaterial Sensor |
| Sprache: | Englisch |
| Publikationsjahr: | 2011 |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Applied Physics A |
| Jahrgang/Volume einer Zeitschrift: | 103 |
| (Heft-)Nummer: | 3 |
| Kurzbeschreibung (Abstract): | The extraction of capacitive profiles with a planar metamaterial sensor is presented. The sensor is build up using a tailored Composite right/left-handed transmission line (CRLH-TL). The capacitance values along the line can be evaluated by measuring the broadband line input impedance followed by applying a dedicated extraction method based on classical network synthesis with a combination of the Cauer canonical forms (CCF) I and II to obtain the values of the corresponding lumped elements in the equivalent circuit. Two prototype sensors have been developed and tested to prove the concept. The areas of application of these types of sensors are transportation of materials in industrial processes where the position of the Material Under Test (MUT) is of interest and can be derived from the changes in the capacitances. |
| Fachbereich(e)/-gebiet(e): | 18 Fachbereich Elektrotechnik und Informationstechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP) > Mikrowellentechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP) |
| Hinterlegungsdatum: | 27 Jan 2012 15:20 |
| Letzte Änderung: | 03 Jun 2020 10:11 |
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