Puentes, M. ; Schuessler, M. ; Penirschke, A. ; Damm, C. ; Jakoby, R. (2010)
Metamaterials in Microwave Sensing Applications.
International Conference IEEE Sensors 2010. Hawaii, USA (01.11.2010-04.11.2010)
Konferenzveröffentlichung, Bibliographie
Kurzbeschreibung (Abstract)
Metamaterials are arti?cial structures that have some unique properties suitable for a wide range of sensing applications. Based on these structures we have developed different types of sensors, using combined right/left- handed(CRLH) metamaterial transmission lines(TL). A cylindrical mass ?ow sensor and two types of planar sensors for position detection are presented. The area of application of these prototypes is industrial processes, where the sensing and control of all tasks involved in a system is crucial for a successful performance. All the sensor prototypes are analyzed and tested in dedicated measurement setups to proof the concepts.
| Typ des Eintrags: | Konferenzveröffentlichung |
|---|---|
| Erschienen: | 2010 |
| Autor(en): | Puentes, M. ; Schuessler, M. ; Penirschke, A. ; Damm, C. ; Jakoby, R. |
| Art des Eintrags: | Bibliographie |
| Titel: | Metamaterials in Microwave Sensing Applications |
| Sprache: | Englisch |
| Publikationsjahr: | November 2010 |
| Ort: | Hawaii, USA |
| Veranstaltungstitel: | International Conference IEEE Sensors 2010 |
| Veranstaltungsort: | Hawaii, USA |
| Veranstaltungsdatum: | 01.11.2010-04.11.2010 |
| Kurzbeschreibung (Abstract): | Metamaterials are arti?cial structures that have some unique properties suitable for a wide range of sensing applications. Based on these structures we have developed different types of sensors, using combined right/left- handed(CRLH) metamaterial transmission lines(TL). A cylindrical mass ?ow sensor and two types of planar sensors for position detection are presented. The area of application of these prototypes is industrial processes, where the sensing and control of all tasks involved in a system is crucial for a successful performance. All the sensor prototypes are analyzed and tested in dedicated measurement setups to proof the concepts. |
| Fachbereich(e)/-gebiet(e): | 18 Fachbereich Elektrotechnik und Informationstechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP) > Mikrowellentechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP) |
| Hinterlegungsdatum: | 27 Jan 2012 15:20 |
| Letzte Änderung: | 23 Mai 2024 10:54 |
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