Gaebler, A. ; Goelden, F. ; Karabey, O. H. ; Jakoby, Rolf (2010)
A FDFD based Eigen-Dielectric Formulation of the Maxwell Equations for Material Characterization in Arbitrary Waveguide Structures.
Proceedings of International Microwave Symposium.
Konferenzveröffentlichung, Bibliographie
Kurzbeschreibung (Abstract)
This paper presents a novel numerical scheme for the extraction of di- electric material parameters using the transmission line method. This method is performed by formulating the discretized Maxwell equa- tions as an eigenpermittivity, permeability or an eigenconductivity problem of the considered sample within an arbitrary and generally inhomogeneous filled waveguide cross section. This allows the direct calculation of the desired material parameter by performing only one full wave simulation. Hence, it is very useful if simplified analytical ap- proaches do not provide the aimed accuracy or even fail completely. This procedure will be demonstrated by applying a modified 2D Finite Differences Frequency Domain scheme to the complex permittivity simulation of arbitrary shaped and placed samples within a waveguide cross section.
| Typ des Eintrags: | Konferenzveröffentlichung |
|---|---|
| Erschienen: | 2010 |
| Autor(en): | Gaebler, A. ; Goelden, F. ; Karabey, O. H. ; Jakoby, Rolf |
| Art des Eintrags: | Bibliographie |
| Titel: | A FDFD based Eigen-Dielectric Formulation of the Maxwell Equations for Material Characterization in Arbitrary Waveguide Structures |
| Sprache: | Englisch |
| Publikationsjahr: | 2010 |
| Veranstaltungstitel: | Proceedings of International Microwave Symposium |
| Kurzbeschreibung (Abstract): | This paper presents a novel numerical scheme for the extraction of di- electric material parameters using the transmission line method. This method is performed by formulating the discretized Maxwell equa- tions as an eigenpermittivity, permeability or an eigenconductivity problem of the considered sample within an arbitrary and generally inhomogeneous filled waveguide cross section. This allows the direct calculation of the desired material parameter by performing only one full wave simulation. Hence, it is very useful if simplified analytical ap- proaches do not provide the aimed accuracy or even fail completely. This procedure will be demonstrated by applying a modified 2D Finite Differences Frequency Domain scheme to the complex permittivity simulation of arbitrary shaped and placed samples within a waveguide cross section. |
| Fachbereich(e)/-gebiet(e): | 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP) > Mikrowellentechnik 18 Fachbereich Elektrotechnik und Informationstechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP) |
| Hinterlegungsdatum: | 27 Jan 2012 15:20 |
| Letzte Änderung: | 05 Mär 2013 09:58 |
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