Vijayaraghavan, Aravind ; Timmermans, Marina Y. ; Grigoras, Kestutis ; Nasibulin, Albert G. ; Kauppinen, Esko I. ; Krupke, Ralph (2011)
Imaging conduction pathways in carbon nanotube network transistors by voltage-contrast scanning electron microscopy.
In: Nanotechnology, 22 (26)
doi: 10.1088/0957-4484/22/26/265715
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
The performance of field-effect transistors based on single-walled carbon nanotube (SWCNT) networks depends on the electrical percolation of semiconducting and metallic nanotube pathways within the network. We present voltage-contrast scanning electron microscopy (VC-SEM) as a new tool for imaging percolation in a SWCNT network with nano-scale resolution. Under external bias, the secondary-electron contrast of SWCNTs depends on their conductivity, and therefore it is possible to image the preferred conduction pathways within a network by following the contrast evolution under bias in a scanning electron microscope. The experimental VC-SEM results are correlated to percolation models of SWCNT-bundle networks.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2011 |
| Autor(en): | Vijayaraghavan, Aravind ; Timmermans, Marina Y. ; Grigoras, Kestutis ; Nasibulin, Albert G. ; Kauppinen, Esko I. ; Krupke, Ralph |
| Art des Eintrags: | Bibliographie |
| Titel: | Imaging conduction pathways in carbon nanotube network transistors by voltage-contrast scanning electron microscopy |
| Sprache: | Englisch |
| Publikationsjahr: | 18 Mai 2011 |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Nanotechnology |
| Jahrgang/Volume einer Zeitschrift: | 22 |
| (Heft-)Nummer: | 26 |
| DOI: | 10.1088/0957-4484/22/26/265715 |
| Kurzbeschreibung (Abstract): | The performance of field-effect transistors based on single-walled carbon nanotube (SWCNT) networks depends on the electrical percolation of semiconducting and metallic nanotube pathways within the network. We present voltage-contrast scanning electron microscopy (VC-SEM) as a new tool for imaging percolation in a SWCNT network with nano-scale resolution. Under external bias, the secondary-electron contrast of SWCNTs depends on their conductivity, and therefore it is possible to image the preferred conduction pathways within a network by following the contrast evolution under bias in a scanning electron microscope. The experimental VC-SEM results are correlated to percolation models of SWCNT-bundle networks. |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Molekulare Nanostrukturen 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften |
| Hinterlegungsdatum: | 08 Nov 2011 10:39 |
| Letzte Änderung: | 05 Mär 2013 09:55 |
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