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Interface Investigation in Nanostructured BaTiO3/silica Composite Ceramics

Chung, U-Chan and Elissalde, Catherine and Mompiou, Frédéric and Majimel, Jérôme and Gomez, Sonia and Estournès, Claude and Marinel, Sylvain and Klein, Andreas and Weill, François and Michau, Dominique and Mornet, Stéphane and Maglione, Mario (2010):
Interface Investigation in Nanostructured BaTiO3/silica Composite Ceramics.
In: Journal of the American Ceramic Society, pp. 865-874, 93, ISSN 00027820,
[Article]

Abstract

Silica-coated ferroelectric particles are promising building blocks for functional bulk composites such as dielectric resonators, supercapacitors or multiferroics. The ferroelectric/silica interface was fully investigated by means of high temperature in-situ X-ray diffraction (XRD), High Resolution Scanning Electron Microscopy (HRSEM) and X-ray photoelectron spectroscopy (XPS). Mechanisms occurring at the interface were visualized by high resolution post-mortem and in-situ Transmission Electron Microscopy (TEM) performed at different temperatures. On the light of this interface investigation, we have used advanced sintering processes such as Spark Plasma Sintering (SPS) and Microwave Sintering to obtain nanostructured composite ceramics and to evaluate their dielectric properties.

Item Type: Article
Erschienen: 2010
Creators: Chung, U-Chan and Elissalde, Catherine and Mompiou, Frédéric and Majimel, Jérôme and Gomez, Sonia and Estournès, Claude and Marinel, Sylvain and Klein, Andreas and Weill, François and Michau, Dominique and Mornet, Stéphane and Maglione, Mario
Title: Interface Investigation in Nanostructured BaTiO3/silica Composite Ceramics
Language: English
Abstract:

Silica-coated ferroelectric particles are promising building blocks for functional bulk composites such as dielectric resonators, supercapacitors or multiferroics. The ferroelectric/silica interface was fully investigated by means of high temperature in-situ X-ray diffraction (XRD), High Resolution Scanning Electron Microscopy (HRSEM) and X-ray photoelectron spectroscopy (XPS). Mechanisms occurring at the interface were visualized by high resolution post-mortem and in-situ Transmission Electron Microscopy (TEM) performed at different temperatures. On the light of this interface investigation, we have used advanced sintering processes such as Spark Plasma Sintering (SPS) and Microwave Sintering to obtain nanostructured composite ceramics and to evaluate their dielectric properties.

Journal or Publication Title: Journal of the American Ceramic Society
Volume: 93
Uncontrolled Keywords: BaTiO3 SiO2 core-shell particles TEM XPS fresnoite XRD dielectric properties
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 29 Oct 2011 08:13
Identification Number: doi:10.1111/j.1551-2916.2009.03474.x
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