Ensling, D. ; Thißen, A. ; Gassenbauer, Y. ; Klein, Andreas ; Jaegermann, W. (2005)
In-Situ Preparation and Analysis of Functional Oxides.
In: Advanced Engineering Materials, 7 (10)
doi: 10.1002/adem.200500125
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Performance degradation of functional oxide materials and interfaces is – besides structural changes – caused by changes of the chemical composition, the electronic structure and the surface and interface potentials. In-situ preparation and analysis for LiCoO2 thin films and for ITO/ZnPc interfaces are presented in this work. Sample stoichiometries, electronic structure and surface and interface potentials with photoelectron spectroscopy are analysed under well defined conditions.
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