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Model-based Coverage-Driven Test Suite Generation for Software Product Lines

Cichos, Harald and Oster, Sebastian and Lochau, Malte and Schürr, Andy (2011):
Model-based Coverage-Driven Test Suite Generation for Software Product Lines.
In: Lecture Notes in Computer Science (LNCS), 6981, In: Proceedings of the ACM/IEEE 14th International Conference on Model Driven Engineering Languages and Systems (MoDELS), pp. 425-439, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2011
Creators: Cichos, Harald and Oster, Sebastian and Lochau, Malte and Schürr, Andy
Title: Model-based Coverage-Driven Test Suite Generation for Software Product Lines
Language: English
Title of Book: Proceedings of the ACM/IEEE 14th International Conference on Model Driven Engineering Languages and Systems (MoDELS)
Series Name: Lecture Notes in Computer Science (LNCS)
Volume: 6981
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering > Real-Time Systems
20 Department of Computer Science
18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering
Date Deposited: 22 Aug 2011 16:22
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