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Constrained sintering of glass films: Microstructure evolution assessed through synchrotron computed microtomography

Bernard, D. ; Guillon, Olivier ; Combaret, N. ; Plougonven, E. (2011)
Constrained sintering of glass films: Microstructure evolution assessed through synchrotron computed microtomography.
In: Acta Materialia, 59 (16)
doi: 10.1016/j.actamat.2011.06.022
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

Glass films composed of 7 μm spherical particles were deposited on rigid substrates and sintered to different densities up to 98%. Synchrotron computed microtomography was used to obtain 3-D images representative of the samples. Several global and local 3-D approaches were tested to quantify microstructure evolution, including the autocorrelation function, and compared to information provided by 2-D sections. These methods provide new tools to understand the effect of geometrical constraints on the sintering process.

Typ des Eintrags: Artikel
Erschienen: 2011
Autor(en): Bernard, D. ; Guillon, Olivier ; Combaret, N. ; Plougonven, E.
Art des Eintrags: Bibliographie
Titel: Constrained sintering of glass films: Microstructure evolution assessed through synchrotron computed microtomography
Sprache: Englisch
Publikationsjahr: September 2011
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Acta Materialia
Jahrgang/Volume einer Zeitschrift: 59
(Heft-)Nummer: 16
DOI: 10.1016/j.actamat.2011.06.022
Kurzbeschreibung (Abstract):

Glass films composed of 7 μm spherical particles were deposited on rigid substrates and sintered to different densities up to 98%. Synchrotron computed microtomography was used to obtain 3-D images representative of the samples. Several global and local 3-D approaches were tested to quantify microstructure evolution, including the autocorrelation function, and compared to information provided by 2-D sections. These methods provide new tools to understand the effect of geometrical constraints on the sintering process.

Freie Schlagworte: Microstructure; Constrained sintering; Glass; Synchrotron microtomography; Image analysis
Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Nichtmetallisch-Anorganische Werkstoffe
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
11 Fachbereich Material- und Geowissenschaften
Hinterlegungsdatum: 19 Aug 2011 10:39
Letzte Änderung: 05 Mär 2013 09:53
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