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Bipolar charge-carrier injection in semiconductor/insulator/conductor heterostructures: Self-consistent consideration

Yampolskii, Sergey V. ; Genenko, Yuri A. ; Melzer, Christian ; Stegmaier, Katja ; Seggern, Heinz von (2008)
Bipolar charge-carrier injection in semiconductor/insulator/conductor heterostructures: Self-consistent consideration.
In: Journal of Applied Physics, 104 (7)
doi: 10.1063/1.2990051
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

A self-consistent model of bipolar charge-carrier injection and transport processes in a semiconductor/insulator/conductor system is developed, which incorporates space-charge effects in the description of the injection process. The amount of charge carriers injected is strongly determined by the energy barrier emerging at the contact, but at the same time the electrostatic potential generated by the injected charge carriers modifies the height of this injection barrier itself. In our model, self-consistency is obtained by assuming continuity of the electric displacement and of the electrochemical potential all over the system. The constituents of the system are properly taken into account by means of their respective density of state distributions. The consequences resulting from our model are discussed on the basis of an indium tin oxide/organic semiconductor/conductor structure. The distributions of the charge carriers and the electric field through the electrodes and the organic layer are calculated. The recombination- and current-voltage characteristics are analyzed for different heights of injection barriers and varying values of the recombination rate and compared with the measured current-voltage dependences for an indium tin oxide/poly(phenylene vinylene)/Ca structure. The voltage dependences of the recombination efficiency for the different values of injection barriers and recombination rate reveal optimum conditions for the device performance.

Typ des Eintrags: Artikel
Erschienen: 2008
Autor(en): Yampolskii, Sergey V. ; Genenko, Yuri A. ; Melzer, Christian ; Stegmaier, Katja ; Seggern, Heinz von
Art des Eintrags: Bibliographie
Titel: Bipolar charge-carrier injection in semiconductor/insulator/conductor heterostructures: Self-consistent consideration
Sprache: Englisch
Publikationsjahr: Oktober 2008
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Journal of Applied Physics
Jahrgang/Volume einer Zeitschrift: 104
(Heft-)Nummer: 7
DOI: 10.1063/1.2990051
Kurzbeschreibung (Abstract):

A self-consistent model of bipolar charge-carrier injection and transport processes in a semiconductor/insulator/conductor system is developed, which incorporates space-charge effects in the description of the injection process. The amount of charge carriers injected is strongly determined by the energy barrier emerging at the contact, but at the same time the electrostatic potential generated by the injected charge carriers modifies the height of this injection barrier itself. In our model, self-consistency is obtained by assuming continuity of the electric displacement and of the electrochemical potential all over the system. The constituents of the system are properly taken into account by means of their respective density of state distributions. The consequences resulting from our model are discussed on the basis of an indium tin oxide/organic semiconductor/conductor structure. The distributions of the charge carriers and the electric field through the electrodes and the organic layer are calculated. The recombination- and current-voltage characteristics are analyzed for different heights of injection barriers and varying values of the recombination rate and compared with the measured current-voltage dependences for an indium tin oxide/poly(phenylene vinylene)/Ca structure. The voltage dependences of the recombination efficiency for the different values of injection barriers and recombination rate reveal optimum conditions for the device performance.

Freie Schlagworte: charge injection, electron-hole recombination, MIS structures, semiconductor-insulator boundaries, space charge
Zusätzliche Informationen:

SFB 595 Cooperation C5, D4

Fachbereich(e)/-gebiet(e): DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > C - Modellierung > Teilprojekt C5: Phänomenologische Modellierung von Injektion, Transport und Rekombination in Bauelementen aus organischen Halbleitern sowie aus nichtorganischen Ferroelektrika
DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > D - Bauteileigenschaften > Teilprojekt D4: Betriebsbedingte Ermüdung von Bauelementen aus organischen Halbleitern
DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > C - Modellierung
DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > D - Bauteileigenschaften
DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung
Zentrale Einrichtungen
DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche
DFG-Sonderforschungsbereiche (inkl. Transregio)
Hinterlegungsdatum: 14 Sep 2011 12:52
Letzte Änderung: 05 Mär 2013 09:52
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