Klein, Sylke and Hahn, and Balogh, and Rück, and Baumann, and Michelmann, (1995):
Amorphisation of (100) oriented silicon by self implantation.
In: Institut für Kernphysik der J. W. Goethe Universität, Frankfurt/Main: Jahresbericht 1995, S. 45, [Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 1995 |
| Creators: | Klein, Sylke and Hahn, and Balogh, and Rück, and Baumann, and Michelmann, |
| Title: | Amorphisation of (100) oriented silicon by self implantation |
| Language: | English |
| Journal or Publication Title: | Institut für Kernphysik der J. W. Goethe Universität, Frankfurt/Main: Jahresbericht 1995, S. 45 |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences) |
| Date Deposited: | 19 Nov 2008 16:00 |
| License: | [undefiniert] |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
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