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Characterization of Defect Structure in Acceptor-Modified Piezoelectric Ceramics by Multifrequency and Multipulse Electron Paramagnetic Resonance Spectroscopy

Eichel, Rüdiger-A. (2008)
Characterization of Defect Structure in Acceptor-Modified Piezoelectric Ceramics by Multifrequency and Multipulse Electron Paramagnetic Resonance Spectroscopy.
In: Journal of the American Ceramic Society, 91 (3)
doi: 10.1111/j.1551-2916.2008.02303.x
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

The defect chemistry in the vicinity aliovalent acceptor-type transition-metal functional centers in piezoelectric perovskite oxides is characterized by means of multifrequency and multipulse electron paramagnetic resonance spectroscopy, assisted by density-functional theory calculations. The focus is on the formation of charged /Fe'Zr,Ti-V0°°)° and neutral (Cu''Zr,Ti-V0°°)* defect dipoles, which are discussed causing internal bias fields, as well as isovalent manganese substitutes. Based on this nanoscale characterization of the defect structure, its impact on macroscopic material properties is discussed.

Typ des Eintrags: Artikel
Erschienen: 2008
Autor(en): Eichel, Rüdiger-A.
Art des Eintrags: Bibliographie
Titel: Characterization of Defect Structure in Acceptor-Modified Piezoelectric Ceramics by Multifrequency and Multipulse Electron Paramagnetic Resonance Spectroscopy
Sprache: Englisch
Publikationsjahr: März 2008
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Journal of the American Ceramic Society
Jahrgang/Volume einer Zeitschrift: 91
(Heft-)Nummer: 3
DOI: 10.1111/j.1551-2916.2008.02303.x
Kurzbeschreibung (Abstract):

The defect chemistry in the vicinity aliovalent acceptor-type transition-metal functional centers in piezoelectric perovskite oxides is characterized by means of multifrequency and multipulse electron paramagnetic resonance spectroscopy, assisted by density-functional theory calculations. The focus is on the formation of charged /Fe'Zr,Ti-V0°°)° and neutral (Cu''Zr,Ti-V0°°)* defect dipoles, which are discussed causing internal bias fields, as well as isovalent manganese substitutes. Based on this nanoscale characterization of the defect structure, its impact on macroscopic material properties is discussed.

Zusätzliche Informationen:

SFB 595 B1

Fachbereich(e)/-gebiet(e): DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > B - Charakterisierung > Teilprojekt B1: EPR Untersuchung von Defekten in ferroelektrischen keramischen Werkstoffen
DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > B - Charakterisierung
DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung
Zentrale Einrichtungen
DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche
DFG-Sonderforschungsbereiche (inkl. Transregio)
Hinterlegungsdatum: 08 Aug 2011 10:45
Letzte Änderung: 05 Mär 2013 09:51
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