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Photoelectron spectroscopy study of oxygen vacancy on vanadium oxides surface

Wu, Qi-Hui and Thissen, Andreas and Jaegermann, Wolfram and Liu, Meilin (2004):
Photoelectron spectroscopy study of oxygen vacancy on vanadium oxides surface.
In: Applied Surface Science, 236 (1-4), pp. 473-478, ISSN 01694332,
[Online-Edition: http://dx.doi.org/10.1016/j.apsusc.2004.05.112],
[Article]

Abstract

The thermal properties of vanadium pentoxide (V2O5) thin films have been studied by X-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS). XPS and UPS data demonstrate that V2O5 thin films are gradually reduced by annealing in the ultrahigh vacuum chamber at temperatures up to 400 °C due to the formation of oxygen vacancy. The oxygen defect in the remaining thin film leads to the appearance of a new emission line at about 10.3 eV in the valence bands, which is direct evidence for oxygen vacancy on a solid surface.

Item Type: Article
Erschienen: 2004
Creators: Wu, Qi-Hui and Thissen, Andreas and Jaegermann, Wolfram and Liu, Meilin
Title: Photoelectron spectroscopy study of oxygen vacancy on vanadium oxides surface
Language: English
Abstract:

The thermal properties of vanadium pentoxide (V2O5) thin films have been studied by X-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS). XPS and UPS data demonstrate that V2O5 thin films are gradually reduced by annealing in the ultrahigh vacuum chamber at temperatures up to 400 °C due to the formation of oxygen vacancy. The oxygen defect in the remaining thin film leads to the appearance of a new emission line at about 10.3 eV in the valence bands, which is direct evidence for oxygen vacancy on a solid surface.

Journal or Publication Title: Applied Surface Science
Volume: 236
Number: 1-4
Uncontrolled Keywords: Vanadium pentoxide; XPS; UPS; Oxygen vacancy 79.60
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Zentrale Einrichtungen
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > A - Synthesis
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > A - Synthesis > Subproject A3: Boundary layers and thin films of ionic conductors: Electronic structure, electrochemical potentials, defect formation and degradation mechanisms
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres
DFG-Collaborative Research Centres (incl. Transregio)
Date Deposited: 04 Aug 2011 09:40
Official URL: http://dx.doi.org/10.1016/j.apsusc.2004.05.112
Additional Information:

SFB 595 A3

Identification Number: doi:10.1016/j.apsusc.2004.05.112
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