Wu, Qi-Hui and Thissen, Andreas and Jaegermann, Wolfram and Liu, Meilin (2004):
Photoelectron spectroscopy study of oxygen vacancy on vanadium oxides surface.
In: Applied Surface Science, 236 (1-4), pp. 473-478. ISSN 01694332,
[Article]
Abstract
The thermal properties of vanadium pentoxide (V2O5) thin films have been studied by X-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS). XPS and UPS data demonstrate that V2O5 thin films are gradually reduced by annealing in the ultrahigh vacuum chamber at temperatures up to 400 °C due to the formation of oxygen vacancy. The oxygen defect in the remaining thin film leads to the appearance of a new emission line at about 10.3 eV in the valence bands, which is direct evidence for oxygen vacancy on a solid surface.
| Item Type: | Article |
|---|---|
| Erschienen: | 2004 |
| Creators: | Wu, Qi-Hui and Thissen, Andreas and Jaegermann, Wolfram and Liu, Meilin |
| Title: | Photoelectron spectroscopy study of oxygen vacancy on vanadium oxides surface |
| Language: | English |
| Abstract: | The thermal properties of vanadium pentoxide (V2O5) thin films have been studied by X-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS). XPS and UPS data demonstrate that V2O5 thin films are gradually reduced by annealing in the ultrahigh vacuum chamber at temperatures up to 400 °C due to the formation of oxygen vacancy. The oxygen defect in the remaining thin film leads to the appearance of a new emission line at about 10.3 eV in the valence bands, which is direct evidence for oxygen vacancy on a solid surface. |
| Journal or Publication Title: | Applied Surface Science |
| Journal volume: | 236 |
| Number: | 1-4 |
| Uncontrolled Keywords: | Vanadium pentoxide; XPS; UPS; Oxygen vacancy 79.60 |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Surface Science Zentrale Einrichtungen DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > A - Synthesis DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > A - Synthesis > Subproject A3: Boundary layers and thin films of ionic conductors: Electronic structure, electrochemical potentials, defect formation and degradation mechanisms DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres DFG-Collaborative Research Centres (incl. Transregio) |
| Date Deposited: | 04 Aug 2011 09:40 |
| Official URL: | http://dx.doi.org/10.1016/j.apsusc.2004.05.112 |
| Additional Information: | SFB 595 A3 |
| Identification Number: | doi:10.1016/j.apsusc.2004.05.112 |
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